1996
DOI: 10.1088/0268-1242/11/5/010
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Free and bound excitons in thin wurtzite GaN layers on sapphire

Abstract: Free and bound excitons have been studied by photoluminescence in thin (1-10 µm) wurtzite-undoped GaN, n-type GaN:Si as well as p-type GaN:Mg and GaN:Zn layers grown by metal-organic chemical vapour phase deposition (MOCVD). An accurate value for the free A exciton binding energy and an estimate for the isotropically averaged hole mass of the uppermost 9 valence band are deduced from the data on undoped samples. The acceptor-doped samples reveal recombination lines which are attributed to excitons bound to Mg … Show more

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Cited by 115 publications

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“…From equation ( 5), we estimate E D = 36 ± 0.5 meV, in agreement with the precise value E D = 35.5 meV obtained by Fourier transform infrared absorption on thick films [37]. Lower values for E LD have been found in thin GaN layers grown on sapphire or SiC (down to 5.9 meV [5]), probably due to strain. For bulk or thick layers the same value E LD = 7.2 meV was reported [4], whereas values of 6.1 meV [12] and 7.4 meV [13] were found for GaN/GaN.…”
Section: The 34714 Ev Line (D 0 X 2 )
supporting
confidence: 87%
“…For kT comparable to E LD (=7.2 meV), the excitons are thermally released from the shallow donor to contribute to FX emission [5,17,36]. From equation ( 5), we estimate E D = 36 ± 0.5 meV, in agreement with the precise value E D = 35.5 meV obtained by Fourier transform infrared absorption on thick films [37].…”
Section: The 34714 Ev Line (D 0 X 2 )
supporting
confidence: 84%
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