Fourier transform infrared reflection absorption spectrometry and electron spectroscopy for chemical analysis for surface analysis

IR External Reflection Spectroscopy: A PROBE FOR CHEMICALLY MODIFIED SURFACES

“…This technique, combined with insights from classical electromagnetic theory for optimizing surface sensitivity, has led to 0003-2700/88/A360-1143/$01.50/0 © 1988 American Chemical Society the widespread application of IR-ERS to the molecular-level characterization of surfaces with high IR reflectivity, such as the noble metals. Numerous technologically and fundamentally significant areas are currently being investigated (2)(3)(4)(5): adhesion, electrocatalysis, corrosion inhibition, and microelectronics. Furthermore, promising strategies for applying IR-ERS to the more complex characterization of surfaces with low IR reflectivity, such as glassy carbon (6,7), silicon (8), and water (9), are reaching crucial stages of development.…”

Fourier Transform Infrared Reflection–absorption Spectroscopy

“…Using a fixed polarizer oriented parallel to the plane of reflection, Ishitani et al (1982) attained surface sensitivity sufficient to measure the reflection-absorption spectra of thin layers down to 90 A for a number of samples without being restricted by the surface area of the sample. They Wavenumber, cm" 1 Fig.…”

“…These organized assemblies have been studied since the first reports of Langmuir (1917) and Blodgett (1939Blodgett ( , 1953) by a variety of techniques. The 90-Ä film represents the limit of detection for this experiment (Ishitani et al, 1982). 9.…”

“…9. Film thicknesses were determined by ellipsometry (Ishitani et al, 1982). The 90-Ä film represents the limit of detection for this experiment (Ishitani et al, 1982).…”

Infrared reflection-absorption spectroscopy of thin film structures

“…10 shows the PM-FTIRRAS spectra of a 200 Â film of PMMA on copper, A single small absorption in the spectrum of the copper substrate (b) at 945 cm"^ was assigned to a thin film of AI2O3 on aluminum[201]-[203]. The band was the result of the thin oxide layer on the aluminum mirrors along the optical path of the spectrometer.…”