Fourier-limited seeded soft x-ray laser pulse

Guilbaud, Olivier; Tissandier, F.; Goddet, Jean-Philippe; Ribière, M.; Sebban, S.; Gautier, J.; Joyeux, D.; Ros, D.; Cassou, K.; Kazamias, S.; Klisnick, A.; Habib, J.; Zeitoun, Ph.; Benredjem, D.; Mocek, Tomáš; Nedjl, J.; Rossi, Sébastien de; Maynard, G.; Cros, B.; Boudaa, A.; Calisti, A.

doi:10.1364/ol.35.001326

Cited by 24 publications

(17 citation statements)

References 13 publications

Supporting

Mentioning

Contrasting

Unclassified

Order By: Relevance

“…The spectral line width is observed to decrease slightly, when increasing the 3.11 ± 0.25 2.60 ± 0.42 2.27 ± 0.34 2.18 ± 0.34 length of the plasma amplifier from 2 mm to 4 mm. Such behaviour is consistent with gain narrowing and was already observed in another experiment performed with the OFI seeded X-ray laser [4,11]. By comparing in Table 1 the values of the spectral width to the corresponding values of the coherence length it can be noted that these two quantities do not exhibit the same behaviour.…”

Section: Resultssupporting

confidence: 87%

Temporal coherence measurements of a seeded GRIP transient Ni-like Mo soft X-ray laser

Meng

Alessi

Guilbaud

et al. 2011

UVX 2010 - 10e Colloque Sur Les Sources Cohérentes Et Incohérentes UV, VUV Et X ; Applications Et Développements Récents

Self Cite

View full text Add to dashboard Cite

Abstract. The temporal coherence of seeded and unseeded GRIP transient Ni-like Mo X-ray laser emitting at 18.9 nm was investigated by a wavefront division interferometer. The coherence time of the X-ray laser pulse is found to be of the order of 1.7 ps in the ASE mode and slightly smaller when the amplifier is seeded with a high-order harmonic pulse. The spectral line width is subject to a gain narrowing when increasing the length of the plasma amplifier.

show abstract

Section: Resultssupporting

confidence: 87%

Temporal coherence measurements of a seeded GRIP transient Ni-like Mo soft X-ray laser

Meng

Alessi

Guilbaud

et al. 2011

UVX 2010 - 10e Colloque Sur Les Sources Cohérentes Et Incohérentes UV, VUV Et X ; Applications Et Développements Récents

Self Cite

View full text Add to dashboard Cite

show abstract

“…Les mesures de cohérence temporelle, avec l'interféromètre décrit plus haut, ont été initiées au LULI en 2004 [4], puis poursuivies sur d'autres installations générant différents types de laser XUV [5,6]. Dans cet article, nous résumons les résultats des expériences les plus récentes, dans lesquelles nous avons étudié trois types de laser XUV possédant des caractéristiques différentes.…”

Section: éTude Comparative De Trois Lasers Xuv Collisionnelsunclassified

“…Ce laser est émis à 32 nm à la longueur d'onde de la raie 4d-4p du krypton nickeloïde. Dans une première expérience réalisée avec ce laser, nous avions mesuré un temps de cohérence de ∼5 ps, très proche de la durée d'impulsion de cette source, mesurée indirectement [6]. Une nouvelle mesure a été effectuée récemment en améliorant la qualité de l'alignement et des interférogrammes.…”

Section: Laser Xuv Ofi En Mode Injectéunclassified

“…Rappelons que la largeur spectrale de l'impulsion harmonique injectée dans le plasma est 100 à 1000 fois plus grande que celle de la raie laser XUV. Les simulations numériques effectuées [6] à l'appui de nos mesures montrent que la largeur spectrale de l'harmonique diminue brutalement au cours de l'amplification, mais reste légèrement supérieure. L'effet de rétrécissement de la largeur spectrale de l'harmonique au cours de son amplification a pu être observée dans notre expérience, pour des longueurs de plasma comprises entre 1 et 6 mm [11].…”

Section: Laser Xuv Ofi En Mode Injectéunclassified

See 1 more Smart Citation

Caractérisation spectrale des lasers XUV

Klisnick¹,

Guilbaud²,

Goddet³

et al. 2011

UVX 2010 - 10e Colloque Sur Les Sources Cohérentes Et Incohérentes UV, VUV Et X ; Applications Et Développements Récents

Self Cite

View full text Add to dashboard Cite

show abstract

“…There is an increasing interest in better understanding the spectral behaviour of plasma-based collisional XUV lasers in the last years [1,2,3,4,5]. The main reason is that the shortest pulse duration that was reached until now is limited to ∼ 1 picosecond [6] by the extremely narrow bandwidth of these sources.…”

Section: Introductionmentioning

confidence: 99%

Line profiles of Ni-like collisional XUV laser amplifiers: Particle correlation effects

Calisti

Ferri

Mossé

et al. 2013

High Energy Density Physics

Self Cite

View full text Add to dashboard Cite

We present a detailed analysis of the different processes that contribute to the spectral broadening of the Ni-like Ag XUV laser line, including the effects of particle correlations on the broadening due to the radiator motion (Doppler broadening). We consider two different regimes of collisional excitation pumping: the transient pumping for which ionic temperature is relatively low (the plasma coupling parameter is large), and the quasi steady-state pumping for which the ionic temperature is higher and the plasma coupling parameter is of the order of 1. In both cases, by using classical molecular dynamics simulation techniques, we show that ionic correlations actually modify the radiatormotion broadened profiles and cannot be neglected in evaluating the Doppler effect. The subsequent narrowing of the Doppler component is small compared to the overall linewidth, which includes the effect of homogeneous collisional broadening. However ionic correlations will also affect the amplification of the lasing line, especially when the laser enters the saturation regime, because it will lead to an homogenization of the spectral profile.

show abstract

Fourier-limited seeded soft x-ray laser pulse

Cited by 24 publications

References 13 publications

Temporal coherence measurements of a seeded GRIP transient Ni-like Mo soft X-ray laser

Temporal coherence measurements of a seeded GRIP transient Ni-like Mo soft X-ray laser

Caractérisation spectrale des lasers XUV

Line profiles of Ni-like collisional XUV laser amplifiers: Particle correlation effects

Contact Info

Product

Resources

About