Fourier Filtering of Synchrotron White-Beam Topographs

Pilard, M.; Epelboin, Y.; Soyer, Alain

doi:10.1107/s0021889894011076

Cited by 4 publications

(6 citation statements)

References 6 publications

(6 reference statements)

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“…Images were stored with the TIFF format. They were treated using Triton software, [16][17][18] which runs on a number of Unix workstations. Triton is an interactive program devoted to numerical image processing mainly based on Fourier filtering and wavelet analysis.…”

Section: Texture Analysismentioning

confidence: 99%

Scanning Electron Microscopic Evaluation of the Effects of an Air‐Abrasive System on Dental Implants: A Comparative In Vitro Study Between Machined and Plasma‐Sprayed Titanium Surfaces

Chairay

Boulekbache

Jean

et al. 1997

Journal of Periodontology

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An in vitro comparative study was conducted in order to evaluate the effects of an air-abrasive system on dental implant surfaces. Eight new titanium dental implants, four standard machined implants (machined group), and four standard plasma-sprayed implants (plasma-sprayed group) were selected for investigation. Both neck and body surfaces of the implants were analyzed. Each pair of implants in each group was treated as follows: the spray of the air-abrasive unit was applied to each area for 5 seconds on the first implant and 15 seconds on the second implant. A total of 24 areas were observed: 16 test implants and 8 controls. Scanning electron photomicrographs were analyzed by 3 examiners using a category rating scale (kappa = 0.594). The images were also computerized for texture analysis. The results indicate that a single air-powder abrasive treatment of the dental implants selected for this study modified their exposed surfaces. After treatment, the threaded neck surface of a machined group implant was least affected, whereas the body was the most altered. In the plasma-sprayed group, comparisons between implant surfaces showed little change. In the machined group, more change was observed in both neck and body areas. In all specimens, a 5-second exposure to the air-powder abrasive did not induce deep changes in the surfaces. A 15-second exposure modified all the specimen surfaces. Further studies are needed to evaluate the effect of these changes on the biological osseointegration process.

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Section: Texture Analysismentioning

confidence: 99%

Scanning Electron Microscopic Evaluation of the Effects of an Air‐Abrasive System on Dental Implants: A Comparative In Vitro Study Between Machined and Plasma‐Sprayed Titanium Surfaces

Chairay

Boulekbache

Jean

et al. 1997

Journal of Periodontology

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“…However, the low pass spatial filtering methodology of [4] cannot be directly used for PF enhancement. Firstly, the brightness gradient must be removed.…”

Section: Enhancement Of Images Of Pendellösung Fringes (Pfs) In Sectimentioning

confidence: 99%

“…Artefacts are created due to film damage, phase contrast effects due to dust on collimating slits, scratches on samples and recording films, etc. [4]. This paper examines two different imaging problems related to two different types of topograph: (A) the identification, segmentation and counting of oxide-related precipitates which appear as dark blobs of varying intensity and shape in an image and (B) enhancing and highlighting Pendellösung fringes, which appear as black and white horizontal lines, while removing unwanted vertical and diagonal streaks and artefacts.…”

Section: Introductionmentioning

confidence: 99%

The use of neighbourhood intensity comparisons, morphological gradients and Fourier analysis for automated precipitate counting & Pendellösung fringe analysis in X-ray topography

Murphy

Whelan

McNally

et al. 2004

Eur. Phys. J. Appl. Phys.

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Abstract.Crystal distortions modify the propagation of X-rays in single crystal materials, and X-ray topography can be used to record these modifications on a film thus providing images of the distributions and nature of defects, dislocations, strains, precipitates, etc. in semiconductors. Small variations of contrast, which often need to be analysed can be rendered invisible. Furthermore, artefacts in the films must be removed. This study examines the use of advanced image analysis techniques applied to a selection of X-ray topographs in section transmission mode: (i) the automated counting of oxygen-related precipitates and (ii) the enhancement of Pendellösung fringes. The technique also succeeds in removing unwanted features in the original x-ray topographs such as vertical streaking due to collimating slit phase contrast and strain features near the surface due to the presence of integrated circuit process strains.

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“…The loss of resolution, due to the digitizer, applies to this one-dimensional signal and creates some anisotropy in the stored image in the computer. The resolution is lower along a line than between lines (Pilard, 1995). This may be significant and depends on the camera and on the digitizer.…”

Section: Digitization Of Experimental Imagesmentioning

confidence: 99%

“…When images are digitized, directly during experiments or during post-treatment, image processing allows one to analyze fine structures and to enhance some contrasts of interest (Pilard, Epelboin & Soyer, 1995). Fourier filtering, which is of great interest in such treatment, may be used to remove the noise (Epelboin, Morris & Rimsky, 1993).…”

Section: Introductionmentioning

confidence: 99%

Multiresolution Analysis for the Restoration of Noisy X-ray Topographs

Pilard

Epelboin²

1998

J Appl Cryst

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The principles of multiresolution analysis, which is based on wavelet theory, are reviewed, and it is shown that this technique is well adapted to the restoration of noisy images. In the analysis, a Gaussian white noise which propagates at all scales of the decomposition is assumed. In contrast to Fourier filtering, which is well localized in reciprocal space but not in direct space, multiresolution filtering allows one to suppress the noise without damaging the resolution. Using the example of an image recorded by a TV camera, it is shown that the technique allows one to obtain the same quality as when summing up to 64 frames. Multiresolution analysis may be used in all fields of science where images are damaged by a Gaussian noise.

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Fourier Filtering of Synchrotron White-Beam Topographs

Cited by 4 publications

References 6 publications

Scanning Electron Microscopic Evaluation of the Effects of an Air‐Abrasive System on Dental Implants: A Comparative In Vitro Study Between Machined and Plasma‐Sprayed Titanium Surfaces

Scanning Electron Microscopic Evaluation of the Effects of an Air‐Abrasive System on Dental Implants: A Comparative In Vitro Study Between Machined and Plasma‐Sprayed Titanium Surfaces

The use of neighbourhood intensity comparisons, morphological gradients and Fourier analysis for automated precipitate counting & Pendellösung fringe analysis in X-ray topography

Multiresolution Analysis for the Restoration of Noisy X-ray Topographs

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