Four-wave mixing and nonlinear parameter measurement in a gallium-nitride ridge waveguide

Munk, Dvir; Katzman, Moshe; Westreich, Ohad; Nun, Moran Bin; Lior, Yedidya; Sicron, Noam; Paltiel, Yossi; Zadok, Avi

doi:10.1364/ome.8.000066

Cited by 25 publications

(19 citation statements)

References 31 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Even though Figure 3 illustrates good agreement between several experimental data sets and the theoretical prediction, a few studies have reported n2 for GaN orders of magnitude higher than the ones presented here (not shown in Figure 3), for both positive and negative values [23,44,45]. For some of them (340 × 10 −20 m 2 /W at 0.80 eV [23] and ~1 × 10 −16 m 2 /W at 2.33 eV [44]), the difference may be related to the highly indirect experimental method that was used to measure the nonlinear refractive index, such as four-wave mixing experiments, which are susceptible to larger error. For literature reports that, similar to our work, used the closed-aperture Z-scan technique (−2.9 × 10 −16 m 2 /W at 3.37 eV [45]), significant discrepancies may arise from the fact that pulses with a high repetition rate (82 MHz) which were centered at energies too close to the one-photon absorption edge have been used.…”

Section: Contribution G (Effect) (X 1 X 2 )supporting

confidence: 73%

“…As expected, the design of such devices were supported by several studies on nonlinear optical characterization of GaN's second-order susceptibility [18][19][20][21]. Furthermore, GaN-based devices using high-quality resonators [22] and ridge-waveguides [23] were recently demonstrated to exhibit third-order optical nonlinearities, manifested as four-wave mixing. However, the third-order susceptibility of GaN has not been thoroughly characterized yet, especially in the telecommunication spectral range and when excited with femtosecond pulses.…”

Section: Introductionmentioning

confidence: 68%

See 1 more Smart Citation

Third-Order Nonlinear Spectrum of GaN under Femtosecond-Pulse Excitation from the Visible to the Near Infrared

et al. 2019

View full text Add to dashboard Cite

Gallium nitride (GaN) has been established as a promising candidate for integrated electro-optic and photonic devices, aiming at applications from optical switching to signal processing. Studies of its optical nonlinearities, however, lack spectral coverage, especially in the telecommunications range. In this study, we measured the two-photon absorption coefficient (β) and the nonlinear index of refraction (n2) of GaN from the visible to the near-infrared by using femtosecond laser pulses. We observed an increase of β from (1.0 ± 0.2) to (2.9 ± 0.6) ×10−11 m/W as the photon energy approached the band gap from 1.77 up to 2.25 eV (700–550 nm), while n2 varied from (90 ± 30) ×10−20 up to (265 ± 80) ×10−20 m2/W within a broad spectral range, from 0.80 up to 2.25 eV (1550–550 nm). The results were modeled by applying a theory based on the second-order perturbation theory and the Kramers-Kronig relationship for direct-gap semiconductors, which are important for the development of GaN-based nonlinear photonic devices.

show abstract

Section: Contribution G (Effect) (X 1 X 2 )supporting

confidence: 73%

Section: Introductionmentioning

confidence: 68%

Third-Order Nonlinear Spectrum of GaN under Femtosecond-Pulse Excitation from the Visible to the Near Infrared

et al. 2019

View full text Add to dashboard Cite

show abstract

“…Currently, various characterization techniques allow for measurements of nonlinear optical constants such as the absorption coefficient (β) or the refractive index ( n 2 ). These techniques include the z -scan method (both β and n 2 ) [14], degenerate four-wave mixing (only n 2 ) [15], nearly degenerate three-wave mixing (only n 2 ) [16], optical Kerr gate and ellipse rotation measurements (both β and n 2 ) [17], self-phase modulation (only n 2 ) [18] and Mach–Zehnder interferometry (both β and n 2 ) [19]. However, please note that all these methods measure nonlinearity in the bulk phase or in thin films [20].…”

Section: Introductionmentioning

confidence: 99%

Nonlinear absorption and scattering of a single plasmonic nanostructure characterized by x-scan technique

Jagadale

Murali

Chu

2019

Beilstein J. Nanotechnol.

View full text Add to dashboard Cite

Nonlinear nanoplasmonics is a largely unexplored research area that paves the way for many exciting applications, such as nanolasers, nanoantennas, and nanomodulators. In the field of nonlinear nanoplasmonics, it is highly desirable to characterize the nonlinearity of the optical absorption and scattering of single nanostructures. Currently, the common method to quantify optical nonlinearity is the z-scan technique, which yields real and imaginary parts of the permittivity by moving a thin sample with a laser beam. However, z-scan typically works with thin films, and thus acquires nonlinear responses from ensembles of nanostructures, not from single ones. In this work, we present an x-scan technique that is based on a confocal laser scanning microscope equipped with forward and backward detectors. The two-channel detection offers the simultaneous quantification for the nonlinear behavior of scattering, absorption and total attenuation by a single nanostructure. At low excitation intensities, both scattering and absorption responses are linear, thus confirming the linearity of the detection system. At high excitation intensities, we found that the nonlinear response can be derived directly from the point spread function of the x-scan images. Exceptionally large nonlinearities of both scattering and absorption are unraveled simultaneously for the first time. The present study not only provides a novel method for characterizing nonlinearity of a single nanostructure, but also reports surprisingly large plasmonic nonlinearities.

show abstract

“…Currently, various characterization techniques allow measurements of nonlinear optical constants such as absorption ( ) or refractive index (n2). These techniques include Z-scan (both , n2) [14], degenerate four-wave mixing (only n2) [15], nearly degenerate three-wave mixing (only n2) [16], optical Kerr gate and ellipse rotation (both , n2) [17], self-phase modulation (only n2) [18], Mach-Zehnder interferometry (both , n2) [19] etc. However, please note that all these methods measure nonlinearity in the bulk or thin films [20].…”

Section: Introductionmentioning

confidence: 99%

Determination of nonlinear absorption and scattering in a single plasmonic nanostructure using X-scan technique

Jagadale¹,

Murali²,

Chu³

2019

Preprint

View full text Add to dashboard Cite

Nonlinear nano-plasmonics opens up many exciting opportunities, such as nano-laser, nano-antenna, nano-modulator, etc. A highly desirable tool in the field of nonlinear nano-plasmonics is to characterize nonlinearity of optical absorption and scattering in single nanostructures. Currently, the most widely used method to quantify optical nonlinearity is z-scan, which can derive real and imaginary parts of permittivity through translating a thin sample across a laser focus. However, z-scan typically works with thin films, and thus acquires nonlinear responses from ensemble of nanostructures, not a single one. In this work, we present an X-scan technique, which is based on laser scanning microscopy equipped with forward and backward detectors. The two-channel detection allows simultaneous quantification of nonlinear behaviours of scattering, absorption, as well as total attenuation, from a single nanostructure. At low excitation intensity, both scattering and absorption responses are linear, thus confirming the linearity of detection system. At high excitation intensity, we found that the nonlinear response can be derived directly from the point spread function of X-scan images. Surprisingly high level of nonlinearities in both scattering and absorption are unravelled simultaneously for the first time. Our study not only provides a novel method for characterizing single-nanostructure nonlinearity, but also reports exceptionally large plasmonic nonlinearities.

show abstract

Four-wave mixing and nonlinear parameter measurement in a gallium-nitride ridge waveguide

Cited by 25 publications

References 31 publications

Third-Order Nonlinear Spectrum of GaN under Femtosecond-Pulse Excitation from the Visible to the Near Infrared

Third-Order Nonlinear Spectrum of GaN under Femtosecond-Pulse Excitation from the Visible to the Near Infrared

Nonlinear absorption and scattering of a single plasmonic nanostructure characterized by x-scan technique

Determination of nonlinear absorption and scattering in a single plasmonic nanostructure using X-scan technique

Contact Info

Product

Resources

About