The melting behaviours of two kinds of c-axis oriented YBa2Cu3Ox (YBCO) films with different four-symmetry in-plane orientations were observed in situ by using high temperature optical microscopy. The in-plane orientation was detected by pole figures and the atomic configuration in the vicinity of the interface of one sample was evaluated by electron diffraction and high-resolution transmission electron microscopy. It is found that the melting mode and the thermal stability of the YBCO thin films with different in-plane orientations differ completely from each other. Such a phenomenon is considerably influenced by the geometrical lattice matching between the YBCO thin films and the MgO substrate, as well as the terminal plane of the YBCO thin films.