“…44 We also reported the L1 0 -ordering of Co/Pt multilayer thin lms on thermally oxidized Si (Si/SiO 2 ) substrates by EB evaporation and annealing processes, which was characterized by scanning electron microscope (SEM), grazing incidence X-ray diffraction (GI-XRD), and vibrating sample magnetometer (VSM). [50][51][52] In Pt (6.6 nm)/Co (4.8 nm) bilayer thin lms, graded lms consisting of L1 2 -ordered CoPt 3 , L1 0 -CoPt, and L1 2ordered Co 3 Pt were formed during interdiffusion of the bilayer annealed at 800 C for 30 s by RTA in a vacuum. 50 Because the interdiffusion and L1 0 -ordering of CoPt were in progress owing to the short annealing time of 30 s RTA process and both L1 2 -CoPt 3 and L1 2 -Co 3 Pt do not usually show large H c , an H c in the graded lms was as small as 2.1 kOe.…”