2005
DOI: 10.1016/j.apsusc.2004.09.041
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Formation of epitaxial Al2O3/NiAl(110) films: aluminium deposition

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Cited by 13 publications
(8 citation statements)
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“…The real space lattice constants of the oxide unit cell were determined to be 10.5 Å and 17.9 Å , with an a of 89.5°. These results are in good agreement with previously reported LEED [38] and RHEED results [39] for the 5 Å film on NiAl (1 1 0). The STM image (Fig.…”
Section: Characterization Of Oxide Films Formed In Uhvsupporting
confidence: 93%
“…The real space lattice constants of the oxide unit cell were determined to be 10.5 Å and 17.9 Å , with an a of 89.5°. These results are in good agreement with previously reported LEED [38] and RHEED results [39] for the 5 Å film on NiAl (1 1 0). The STM image (Fig.…”
Section: Characterization Of Oxide Films Formed In Uhvsupporting
confidence: 93%
“…This value is about 10 % larger than the O-O distance in α-and γ-Al 2 O 3 . A lattice expansion of a similar amount has also been observed in the oxide films grown on the (110) surface of the cubic binary alloy AlNi [44,45]. The limited radial spread of the diffraction spots indicates that the domains are almost as large as the terraces of the quasicrystalline substrate.…”
Section: Oxygen Adsorptionsupporting
confidence: 54%
“…The interface orientation of Ni-Al ͑110͒ matching Al 2 O 3 ͑0001͒ has been investigated quite often in experiments. [35][36][37][38][39] However, within those interfacial mismatches, there are a few potential models of the interface with different planar matching or orientation. Traditionally, the model interface for ab initio studies is constructed seeking the configuration with minimum interfacial mismatch, 19,21,[32][33][34]40,41 and usually the material with the smaller modulus is deformed into commensuration with the stiffer material.…”
Section: A Computational Detailsmentioning
confidence: 99%