1997
DOI: 10.1557/proc-483-135
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Formation Mechanism Of Negative Fixed Charge In Glass At Lead Glass/Silicon Interface

Abstract: The physical origins of negative fixed charges at the lead glass/silicon interface have been studied. It was found that a thin p-type region is present on the n-type substrate in the PbO-SiO2-Al2O3 glass/silicon system from the punch-through voltage, pinch-off voltage, and SIMS analysis. A new model of the negative fixed charge was proposed from the MIS structure with the surface pn junction.

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“…The replacement of acid with chloride solutions (e.g., MgCl 2 , NiCl 2 , and NaCl) can prevent strong corrosion while slowing down the kinetic properties. 18,19 The use of additives can further improve the hydrolytic properties of Mg. This includes the introduction of metal additives by alloying (e.g., Mg-rare earth, Mg-Si, Mg-Ca, and Mg-Cu).…”
Section: Introductionmentioning
confidence: 99%
“…The replacement of acid with chloride solutions (e.g., MgCl 2 , NiCl 2 , and NaCl) can prevent strong corrosion while slowing down the kinetic properties. 18,19 The use of additives can further improve the hydrolytic properties of Mg. This includes the introduction of metal additives by alloying (e.g., Mg-rare earth, Mg-Si, Mg-Ca, and Mg-Cu).…”
Section: Introductionmentioning
confidence: 99%