2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) 2020
DOI: 10.1109/asmc49169.2020.9185217
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Formation and Removal of Tungsten Flake and Metallic Film Defects in Tungsten Contact CMP

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“…29 Drying.-The final step of the wet cleaning process is wafer drying, which is an extremely important process. Usually, hot air blowing, 69 spin drying, 70 vacuum drying, 71 vapor drying, 72 IR lamp drying, 8 slow drying from warm water, 73 and nitrogen drying 70 are the methods adopted for wafer drying. The drying procedures can be classified into three groups: Isopropyl alcohol (IPA) vapor drying, spin drying, and Marangoni drying.…”
Section: Post-cmp Cleaning Process and Equipmentmentioning
confidence: 99%
“…29 Drying.-The final step of the wet cleaning process is wafer drying, which is an extremely important process. Usually, hot air blowing, 69 spin drying, 70 vacuum drying, 71 vapor drying, 72 IR lamp drying, 8 slow drying from warm water, 73 and nitrogen drying 70 are the methods adopted for wafer drying. The drying procedures can be classified into three groups: Isopropyl alcohol (IPA) vapor drying, spin drying, and Marangoni drying.…”
Section: Post-cmp Cleaning Process and Equipmentmentioning
confidence: 99%