Formalisms of the Complex Impedance Spectroscopy

Bonaventura, André Luis; Aredes, Rangel Graudiston; Antonelli, Eduardo

doi:10.31219/osf.io/2mtk7

2020

DOI: 10.31219/osf.io/2mtk7

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Formalisms of the Complex Impedance Spectroscopy

André Luis Bonaventura¹,

Rangel Graudiston Aredes²,

Eduardo Antonelli³

Abstract: The Complex Impedance Spectroscopy (CIS) technique is used to characterize materials with electrical and ferroelectric properties. In this paper, we present the 4 formalisms for analyzing the data obtained by the CIS.

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Formalisms of the Complex Impedance Spectroscopy

Abstract: The Complex Impedance Spectroscopy (CIS) technique is used to characterize materials with electrical and ferroelectric properties. In this paper, we present the 4 formalisms for analyzing the data obtained by the CIS.

Cited by 0 publications

References 1 publication

No citations

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