Force microscopy of magnetization patterns in longitudinal recording media

Mamin, H. J.; Rugar, D.; Stern, J. E.; Terris, B. D.; Lambert, S.E.

doi:10.1063/1.99952

Cited by 140 publications

(21 citation statements)

References 9 publications

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“…However, the agreement required a distance between the magnetic point charge and the sample that is much larger than the typical tip-tosample distances used in the experiment. Similar observations have been reported by Belliard et al 14 for a monopole model of the tip, and by Mamin et al 13 for the dipole model of the tip.…”

Section: ͑12͒supporting

confidence: 87%

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A method for the calibration of magnetic force microscopy tips

Schendel

Hug

Stiefel

et al. 2000

Journal of Applied Physics

119

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A method is presented for the analysis of magnetic force microscopy ͑MFM͒ measurements that allows the quantitative determination of the sample stray field. It is shown how measurements on an easily obtainable calibration sample can be used to calibrate the MFM measurement as a function of the wavelength of the sample stray field at the tip apex. It is demonstrated that the thus obtained MFM calibration can be used to determine the stray field distribution of the tip. Furthermore, the effect of the tip on the MFM imaging mechanism is analyzed by comparing it to some simple tip models. From the analysis, it is shown that the point-monopole and dipole models do not accurately describe the MFM imaging mechanism.

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Section: ͑12͒supporting

confidence: 87%

“…12 It is useful to discuss the relation between tip and tip models and calibrations used by other groups. The most commonly used tip model, first proposed by Mamin et al, 13 describes the tip as the sum of an ideal monopole and an ideal dipole ͓Eq. ͑9͔͒.…”

Section: ͑12͒mentioning

confidence: 99%

A method for the calibration of magnetic force microscopy tips

Schendel

Hug

Stiefel

et al. 2000

Journal of Applied Physics

119

View full text Add to dashboard Cite

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“…1(a), a dc voltage +10V was applied between tip and sample to provide the servo force F C for feedback to keep the tip from crashing into the surface during scanning 7 . For the electrostatic force modulation method in Fig.…”

Section: Methodsmentioning

confidence: 99%

Effects of long-range tip-sample interaction on magnetic force imaging: A comparative study between bimorph driven system and electrostatic force modulation

Kim

2012

Journal of Applied Physics

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Magnetic force microscopy (MFM) using electrostatic force modulation has been designed and developed to avoid the drawbacks of the bimorph driven system. The bimorph driven system has poor frequency response and overlap of the topographic features on magnetic structures of the MFM images. In the electrostatic force modulation system, the amplitude increases in the noncontact regime as the tip approaches due to the capacitive coupling between tip and sample. MFM using electrostatic force modulation has been applied to observe maze-like stripe domain structures on a CoCr film. The contrast mechanism and imaging stability of MFM using electrostatic force modulation are discussed by investigating the force distance curves obtained in two magnetic domain regions.

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“…Many magnetic imaging methods presently exist; differential phase contrast electron microscopy, 1 scanning electron microscopy with polarization analysis, 2 magnetic force microscopy, 3 and Kerr optical microscopy, 4 to name a few. The last of these, Kerr microscopy, has enjoyed extensive usage in head development programs throughout the magnetic data storage industry.…”

Section: Introductionmentioning

confidence: 99%

A scanning near-field optical microscope for the imaging of magnetic domains in reflection

Silva

Schultz

1996

Review of Scientific Instruments

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The design and implementation of a scanning near-field optical microscope expressly intended for the imaging of magnetic domains in reflection with subwavelength resolution is described. The microscope employs ϳ40 nm silver particles optically excited at the plasmon resonance as the near-field probes. Special attention is given to the Newton ring interferometer used to regulate the separation between the near-field probe and the sample. The results of two tests of the microscope performance are presented. The first is a measurement of the dependence of the near-field magneto-optic Kerr effect on probe/sample spacing for a longitudinally magnetized metallic thin film. The effect decreases rapidly with increasing separation with a length scale comparable to the probe size. The second is a series of images of a domain in a perpendicularly magnetized multilayer metallic film at different probe/sample spacings. The images indicate a persistent effect with increasing separation but diminishing resolution. Fundamental differences between the near-field magneto-optic Kerr effect for perpendicularly and longitudinally magnetized samples is discussed. An estimate is made as to the fundamental limit of resolution with this particular form of near-field microscopy.

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Force microscopy of magnetization patterns in longitudinal recording media

Cited by 140 publications

References 9 publications

A method for the calibration of magnetic force microscopy tips

A method for the calibration of magnetic force microscopy tips

Effects of long-range tip-sample interaction on magnetic force imaging: A comparative study between bimorph driven system and electrostatic force modulation

A scanning near-field optical microscope for the imaging of magnetic domains in reflection

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