Abstract:Piezoelectric and ferroelectric materials are widely used in various types of microelectronics due to their excellent mechanical and electrical coupling characteristics. In recent years, piezoelectric force microscopy has developed into a powerful tool for analyzing nanoscale ferroelectric materials. However, quantitative analysis based on PFM is difficult to properly study it. This article studies the related issues of PFM quantitative analysis. First, the relationship between the effective piezoelectric coef… Show more
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