2018
DOI: 10.7567/apex.11.086502
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Folding stabilities of encapsulation layers at positions off the mechanical neutral plane

Abstract: The folding stabilities of an inorganic single layer and an organic–inorganic multilayer based on the degree of deviation from the neutral plane were investigated for the application of the encapsulation layer to foldable organic light-emitting diodes. The folding stabilities of the two encapsulation layers were evaluated by measuring the change in water vapor transmission rate (WVTR) after 100,000 repetitive folding times. The organic–inorganic multilayer was found stable despite the repeated folding even tho… Show more

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Cited by 6 publications
(9 citation statements)
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“…We investigated the device degradation with the mechanical strain in the films. [50][51][52][53][54][55] Young's modulus can be used to express the strain applying to OLEDs as a function of film radius and thickness given by In our OLED device on PI, the gas barrier consisting of five layers of SiO 2 /SiN x SiO 2 /SiN x /SiO 2 was deposited on the PI substrate to prevent the oxygen and moisture penetration through the PI substrate. As the TFE, two stacks of parylene and SiN x (total four layers) was used.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…We investigated the device degradation with the mechanical strain in the films. [50][51][52][53][54][55] Young's modulus can be used to express the strain applying to OLEDs as a function of film radius and thickness given by In our OLED device on PI, the gas barrier consisting of five layers of SiO 2 /SiN x SiO 2 /SiN x /SiO 2 was deposited on the PI substrate to prevent the oxygen and moisture penetration through the PI substrate. As the TFE, two stacks of parylene and SiN x (total four layers) was used.…”
Section: Resultsmentioning
confidence: 99%
“…We investigated the device degradation with the mechanical strain in the films. [ 50–55 ] Young's modulus can be used to express the strain applying to OLEDs as a function of film radius and thickness given byσ=E×εtopwithεtop=(dnormalf+dnormals2R)(1+2η+xη2)(1+η)(1+xη)(dnormalf+dnormals2R)where E indicates Young's modulus, σ and εtop are stress and strain, d f and d s are the thicknesses of film and substrate, η = d f / d s and x = E f / E s, R is the radius of curvature, respectively. In our OLED device on PI, the gas barrier consisting of five layers of SiO 2 /SiN x SiO 2 /SiN x /SiO 2 was deposited on the PI substrate to prevent the oxygen and moisture penetration through the PI substrate.…”
Section: Resultsmentioning
confidence: 99%
“…Another important asset related to the copper's thinness is its impact on the mechanical reliability of the stack, as maximum strain under bending is directly correlated to the thickness of the stiffest material (in our case copper). [15,23,24] To assess the mechanical and electrical reliability of the stack, we performed bending tests of copper tracks embedded in parylene using a dedicated setup depicted in Figure 2A. [15] We furthermore limited the strain induced in copper by using the ideal configuration where mechanical neutral plane lies in the metallic layer, therefore encapsulation and substrate have the same thickness.…”
mentioning
confidence: 99%
“…[15] We furthermore limited the strain induced in copper by using the ideal configuration where mechanical neutral plane lies in the metallic layer, therefore encapsulation and substrate have the same thickness. [24] First, a single folding test was performed on a 110-µm-wide track ( Figure 2B). The track shows electrical stability under progressive bending, down to complete folding corresponding to 0.1 mm of radius (right inset picture).…”
mentioning
confidence: 99%
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