Focusing x-ray spectrograph with crossed dispersion

Song, B. M.; Pikuz, S. A.; Shelkovenko, T. A.; Chandler, K. M.; Mitchell, M. D.; Hammer, D. A.

doi:10.1063/1.1535258

Cited by 8 publications

(2 citation statements)

References 3 publications

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“…The X‐rays will be diffracted by the crystal, when they arrive at the crystal plane, and crystal instrument obtains spectra via the Bragg equation. Unlike many commonly used crystals, mica can efficiently reflect up to very high reflection orders, allowing us to simultaneously measure spectra over wide spectral ranges (Song et al, ; Imazono et al, ). In this experiment, we utilize the seventh‐order bright stripe, so the following relation can be obtained:

7 λ = 2 d \sin θ

…”

Section: X‐rays Imaging Experimentsmentioning

confidence: 99%

Study of X‐Ray Imaging with Toroidally Bent Crystal

Shi

Xiao

Liu

et al. 2012

Int J Imaging Syst Tech

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We developed a focusing imager with a toroidally bent crystal imager. The imager can be used in X-ray imaging of laser fusion experiments. This article discusses the focusing properties of toroidally bent crystal in Bragg geometry. Simulations of spatial resolution for toroidally bent crystals with different conditions including source size and detector position were done using the ray-tracing method. The applicable conditions for optimized two-dimensional (2D) imaging of X-ray source are proposed. Toroidally bent crystal of mica with curvature radius 290 mm in the meridional plane and 190 mm in the sagittal plane is used as imaging element in the experiments. The high-quality visible 2D X-ray image was obtained with the imaging plate due to the high collection efficiency of the bent crystal imaging system. It is demonstrated that the toroidally bent mica crystal could be used in X-ray imaging. By analyzing the image information of the sagittal direction, we find out that the toroidal crystal imager has spatial resolution about 34 m.

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7 λ = 2 d \sin θ

…”

Section: X‐rays Imaging Experimentsmentioning

confidence: 99%

Study of X‐Ray Imaging with Toroidally Bent Crystal

Shi

Xiao

Liu

et al. 2012

Int J Imaging Syst Tech

View full text Add to dashboard Cite

show abstract

“…1, λ min and λ max , will be focused on the straight line connecting the source and the detector plane. However, for a small source, the shift of the focal position from the Rowland circle does not decrease the spectral resolution significantly [7] .…”

mentioning

confidence: 96%

High resolution X-ray spherically bent crystal spectrometer for laser-produced plasma diagnostics

Liu¹

2009

Chin. Opt. Lett.

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A new high spectral resolution crystal spectrometer is designed to measure very low emissive X-ray spectra of laser-produced plasma in 0.5−0.9 nm range. A large open aperture (30×20 (mm)) mica (002) spherically bent crystal with curvature radius R = 380 mm is used as dispersive and focusing element. The imaging plate is employed to obtain high spectral resolution with effective area of 30 × 80 (mm). The long designed path of the X-ray spectrometer beam is 980 mm from the source to the detector via the crystal. Experiment is carried out at a 20-J laser facility. X-ray spectra in an absolute intensity scale is obtained from Al laserproduced plasmas created by laser energy of 6.78 J. Samples of spectra obtained with spectral resolution of up to E/∆E ∼ 1500 are presented. The results clearly show that the device is good to diagnose laser high-density plasmas.

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Application of the focusing x-ray spectrograph with crossed dispersion to investigations of X pinch plasmas

Pikuz

Song

Shelkovenko

et al. 2004

Review of Scientific Instruments

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A new focusing spectrograph configuration with crossed dispersion (FSCD) has been developed for use in X pinch experiments. This device solves the problem in a crystal spectrograph of the overlapping of reflected radiation in many orders. The x-ray radiation from a small source is dispersed by a transmission grating before it reaches the Bragg reflector (mica crystal). A large aperture (10 mm×10 mm), 0.5 μm period gold transmission grating was made on a 0.5 μm thick Si3N4 substrate and combined with spherically bent mica crystals with radii of curvature of 100 mm or 186 mm. Results of FSCD application to plasma experiments with X pinch x-ray sources is presented.

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Focusing x-ray spectrograph with crossed dispersion

Cited by 8 publications

References 3 publications

Study of X‐Ray Imaging with Toroidally Bent Crystal

Study of X‐Ray Imaging with Toroidally Bent Crystal

High resolution X-ray spherically bent crystal spectrometer for laser-produced plasma diagnostics

Application of the focusing x-ray spectrograph with crossed dispersion to investigations of X pinch plasmas

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