Focusing with saw-tooth refractive lenses at a high-energy X-ray beamline

Shastri, S. D.; Kenesei, Péter; Mashayekhi, Ali N.; Shade, Paul A.

doi:10.1107/s1600577520003665

Cited by 9 publications

(4 citation statements)

References 18 publications

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“…The energy bandwidth of the monochromated beam is approximately 1 Â 10 À3 . The size of the beam impinging on the sample's volume of interest (VOI) is defined by a series of slits, sometimes in combination with focusing optics (Said & Shastri, 2010;Shastri et al, 2020). 1 Between the final slits and the sample, an ion chamber exists to measure the incident beam flux; its reading is denoted as IC0 hereon.…”

Section: Physical Setup At the 1-id-e Endstationmentioning

confidence: 99%

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Repeatability and sensitivity characterization of the far-field high-energy diffraction microscopy instrument at the Advanced Photon Source

Park¹,

Sharma²,

Kenesei³

2021

J Synchrotron Rad

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In the last two decades, far-field high-energy diffraction microscopy (FF-HEDM) and similar non-destructive techniques have been actively developed at synchrotron light sources around the world. As these techniques (and associated analysis tools) are becoming more available for the general users of these light sources, it is important and timely to characterize their performance and capabilities. In this work, the FF-HEDM instrument implemented at the 1-ID-E endstation of the Advanced Photon Source (APS) is summarized. The set of measurements conducted to characterize the instrument's repeatability and sensitivity to changes in grain orientation and position are also described. When an appropriate grain matching method is used, the FF-HEDM instrument's repeatability is approximately 5 µm in translation, 0.02° in rotation, and 2 × 10−4 in strain; the instrument sensitivity is approximately 5 µm in translation and 0.05° in rotation.

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Section: Physical Setup At the 1-id-e Endstationmentioning

confidence: 99%

“…The origin of x L -y L -z L is denoted as O L . In practice, the vertical blades of the slits are aligned to the x L -z L plane; similarly, when sawtooth refractive lenses are employed (Said & Shastri, 2010;Shastri et al, 2020), the vertically focused planar beam is aligned to the x L -z L plane.…”

Section: Midas Framework For Ff-hedmmentioning

confidence: 99%

Repeatability and sensitivity characterization of the far-field high-energy diffraction microscopy instrument at the Advanced Photon Source

Park¹,

Sharma²,

Kenesei³

2021

J Synchrotron Rad

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“…To acquire the information on the intragranular length scale, the incident X-ray beam should only illuminate part of the grain. Therefore, for the pf-HEDM measurements, the incident beam is focused horizontally and vertically to a size of 15 μm (horizontal) × 2 μm (vertical), which is smaller than the average grain size of the sample, using a pair of silicon compound refractive lenses [102]. During the pf-HEDM data acquisition process, the polycrystalline specimen is mounted on a turntable with a single rotation axis z S and is free to move along the transverse beam directions y L and z L by the translational stage.…”

Section: Pf-hedm Measurementsmentioning

confidence: 99%

Resolving intragranular stress fields in plastically deformed titanium using point-focused high-energy diffraction microscopy

Sharma

Kenesei

et al. 2023

Journal of Materials Research

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The response of a polycrystalline material to a mechanical load depends not only on the response of each individual grain, but also on the interaction with its neighbors. These interactions lead to local, intragranular stress concentrations that often dictate the initiation of plastic deformation and consequently the macroscopic stress–strain behavior. However, very few experimental studies have quantified intragranular stresses across bulk, three-dimensional volumes. In this work, a synchrotron X-ray diffraction technique called point-focused high-energy diffraction microscopy (pf-HEDM) is used to characterize intragranular deformation across a bulk, plastically deformed, polycrystalline titanium specimen. The results reveal the heterogenous stress distributions within individual grains and across grain boundaries, a stress concentration between a low and high Schmid factor grain pair, and a stress gradient near an extension twinning boundary. This work demonstrates the potential for the future use of pf-HEDM for understanding the local deformation associated with networks of grains and informing mesoscale models. Graphical abstract

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“…Several types of devices have been developed for focusing high-energy X-rays above 50 keV, such as Fresnel zone plates (FZPs) (Kamijo et al, 2003;Snigireva et al, 2007;Tamura et al, 2009), multilayer Laue lenses (MLLs) (Li et al, 2023), compound refractive lenses (CRLs) (Snigirev et al, 2004(Snigirev et al, , 2007Vaughan et al, 2010;Shastri et al, 2014Shastri et al, , 2020Brancewicz et al, 2016;Hirao & Ohishi, 2022) and total-reflection Kirkpatrick-Baez (KB) optics (Suzuki et al, 2007;Hayashi et al, 2016). Both FZPs and CRLs are on-axis devices keeping simple optical geometry, while they have chromatic aberration with a reduced throughput.…”

Section: Introductionmentioning

confidence: 99%

Sub-micrometre focusing of intense 100 keV X-rays with multilayer reflective optics

Koyama,

Yumoto,

Miura

et al. 2024

J Synchrotron Radiat

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A high-flux sub-micrometre focusing system was constructed using multilayer focusing mirrors in Kirkpatrick–Baez geometry for 100 keV X-rays. The focusing mirror system had a wide bandwidth of 5% and a high peak reflectivity of 74%. Performance was evaluated at the undulator beamline BL05XU of SPring-8, which produced an intense 100 keV X-ray beam with a bandwidth of 1%. When the light source was focused directly in both vertical and horizontal directions, the beam size was measured to be 0.32 µm (V) × 5.3 µm (H) with a flux of 1 × 1012 photons s−1. However, when a limited horizontal slit was used to form a secondary source, the focusing beam size decreased to 0.25 µm (V) × 0.26 µm (H) with a flux of 6 × 1010 photons s−1. The 200 nm line and space patterns of a Siemens star chart made of tantalum were clearly resolved by the absorption contrast of the focused beam. This 100 keV focusing system is applicable to various fields of nondestructive analyses with sub-micrometre resolutions.

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Focusing with saw-tooth refractive lenses at a high-energy X-ray beamline

Cited by 9 publications

References 18 publications

Repeatability and sensitivity characterization of the far-field high-energy diffraction microscopy instrument at the Advanced Photon Source

Repeatability and sensitivity characterization of the far-field high-energy diffraction microscopy instrument at the Advanced Photon Source

Resolving intragranular stress fields in plastically deformed titanium using point-focused high-energy diffraction microscopy

Sub-micrometre focusing of intense 100 keV X-rays with multilayer reflective optics

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