FMR investigations of exchange biased NiFe/IrMn/NiFe trilayers with high and low Ni relative content

Dzhun, I. O.; Babaytsev, Georgy V.; Чеченин, Н.Г.; Gritsenko, Christina; Rodionova, Valeria

doi:10.1016/j.jmmm.2017.11.028

Cited by 12 publications

(12 citation statements)

References 14 publications

Supporting

Mentioning

Contrasting

Unclassified

Order By: Relevance

“…The non-collinearity of the uniaxial and unidirectional anisotropies, β ≠ 0° was observed in a number of experiments [19]. So, it was stated in [20] that the noncollinearity angle between H EB and H K is significant; i.e., β ≠ 0°, at small thicknesses of the AFM layer less than 10 nm, while η is close to zero at all AFM-layer thicknesses. Relationships ( 3) and ( 4) are simplified if the uniaxial anisotropy η = 0° (or 180°) direction is taken for axis x, which does not change relationships (3) and (4).…”

Section: Fmr In Exchange-bias Structuresmentioning

confidence: 96%

Effect of External Factors on the Ferromagnetic Resonance Line Width in Exchange-Biased Structures

et al. 2021

View full text Add to dashboard Cite

The external factors which influence the ferromagnetic resonance (FMR) line width in bilayer (ferromagnet/antiferromagnet) exchange-biased systems are studied. The dependence of the FMR line width on the antiferromagnetic (AF) layer thickness at a constant ferromagnet (FM) layer thickness are studied for the samples with various sequences of deposition of FM and AFM layers; the correlations between the exchange-bias field and the roughness of the sample surface are studied, too. The exchange bias is found to give insignificant contribution to the FMR line width. In the systems with an antiferromagnet deposited on a ferromagnetic layer, the FMR line width increases proportionally to the average surface roughness size. In the system with inverse arrangement of the layers, the uniaxial anisotropy gives a significant contribution to the line width. The FMR line width is in the quadratic dependence on the uniaxial anisotropy and is inversely proportional to the AFM layer thickness, which can be related to changes in the microstructure with the thickness as an external factor of damping FMR.

show abstract

Section: Fmr In Exchange-bias Structuresmentioning

confidence: 96%

Effect of External Factors on the Ferromagnetic Resonance Line Width in Exchange-Biased Structures

et al. 2021

View full text Add to dashboard Cite

show abstract

“…[10], примененный для оценки уширения линии ФМР под влиянием обменного смещения, экспериментальная зависимость ширины линии ФМР, H, может быть аппроксимирована квадратичной зависимостью от одноосной анизотропии H K . Квадратичная зависимость H(H K ) была получена в работе [20]. Для выделения на фоне других конкурирующих вкладов, на рис.…”

Section: обсуждение результатовunclassified

“…Так в нашей работе[20] установлено, что угол неколинеарности между H EB и H K значителен, т. е. β = 0 • , при малых толщинах АФ-слоя менее 10 nm и постепенно уменьшается при больших толщинах, в то время как η близко к нулю при всех исследованных толщинах АФ.Соотношения(3,4) упрощаются, если за ось x принять направление одноосной анизотропии, η = 0 • (или 180 • , что не меняет соотношения (3,4). Учитывая малость полей по сравнению с 4πM S (4πM S ≫ H r ), получаем ω γ 2 = 4πM S (Hr + H EB cos(α − β) + H K cos 2α) (5) • , 90 • , 180 • и 270 • получаем следующее выражение для величины обменного смещения:…”

unclassified

Влияние Внешних Факторов На Ширину Линии Ферромагнитного Резонанса В Структурах С Обменным Смещением

Dzhun¹,

Бабайцев²,

Kozin³

et al. 2021

Физика Твердого Тела

View full text Add to dashboard Cite

Extrinsic factors contributing to the ferromagnetic resonance (FMR) line width in double layer (ferromagnet/antiferromagnet) systems with exchange bias were investigated. Dependence of the FMR line width on the thickness of the antiferromagnetic (AF) layer at a constant thickness of the ferromagnetic (F) layer and layers deposition order of the F - and AF - layers, as well as the correlation between the exchange bias and the surface roughness of the sample were studied. We found that the exchange bias has a minor, if any, contribution to the line width. In systems with an antiferromagnet deposited on a ferromagnetic layer, the width of the FMR line increases in proportion to the average size of the surface roughness. In systems with reversal layer sequence the uniaxial anisotropy provides a significant contribution to the line width. The width of the FMR line is in a quadratic dependence on the uniaxial anisotropy and inversely proportional to the thickness of the antiferromagnetic layer, which can be attributed to the effect of the microstructure evolution with the thickness as an extrinsic factor in the damping of the FMR.

show abstract

“…It has been shown that in Co 80 Fe 20 /Ir 20 Mn 80 and Ni 80 Fe 20 /Ir 20 Mn 80 films the thermal diffusion of Mn atoms from the Ir-Mn layer into the adjacent Ni-Fe layer is much easier and faster than that into the Co-Fe layer [51]. Most specifically, given that use of low-nickel permalloy provides higher magnetic interface ordering and smaller Ir-Mn critical thickness to set the EB [52], the tendency of Mn to interdiffuse with Ni seems to be much greater than that for Mn-Fe interdiffusion. The Mn-Ni interdiffusion lowers the Ir-Mn anisotropy at the interface as t Py is increased, reducing its pinning capacity and, therefore, the bias.…”

Section: H Mechanisms Determining the Bias And Coercivity Variationsmentioning

confidence: 99%

Unveiling the Mechanisms Governing the Exchange Coupling and Coercivity Modifications in Annealed or Ion-Irradiated Ir−Mn / Fe /
Salazar
¹
,
Pereira
²
,
Grande
³

et al. 2018
Phys. Rev. Applied
3
0
1
0
View full text Add to dashboard Cite

We investigate the modifications of the exchange bias, effective ferromagnet-antiferromagnet (FM-AFM) coupling, and coercivity in annealed or ion-irradiated Ir-Mn/spacer layer (SL)/Co trilayers. A ferromagnetic, either Fe or permalloy (Py), thin SL or a nonmagnetic Ru one with different thicknesses (t SL) is used. The magnetic characterization is performed at room temperature via conventional magnetometry and, partly, via soft-x-ray magnetic circular dichroism. The latter shows that at the FM-AFM interface there is small uncompensated Mn magnetization coupled, preferentially, antiferromagnetically to Fe moments. This indicates the formation of small FeMn clusters that reverse their magnetizations together with those of Co, Ni, and the rest of Fe. Neither annealing nor ion irradiation of the films with t Fe ≥ 0.5 nm changes significantly the pinning part of the FM-AFM interface. In the Py-spacer films, however, the great tendency of Mn to interdiffuse with Ni leads to a decrease of the Ir-Mn anisotropy at the interface, lowering its pinning capacity. While defects created in the bulk of the AFM are mainly responsible for the changes of the magnetic characteristics of the Ir-Mn/Fe/Co films, interdiffusion and defect creation at the FM-AFM interface are the respective mechanisms determining the behavior of the Py-spacer series. These conclusions are reinforced by results for the Ru-spacer series.

show abstract

FMR investigations of exchange biased NiFe/IrMn/NiFe trilayers with high and low Ni relative content

Cited by 12 publications

References 14 publications

Effect of External Factors on the Ferromagnetic Resonance Line Width in Exchange-Biased Structures

Effect of External Factors on the Ferromagnetic Resonance Line Width in Exchange-Biased Structures

Влияние Внешних Факторов На Ширину Линии Ферромагнитного Резонанса В Структурах С Обменным Смещением

Unveiling the Mechanisms Governing the Exchange Coupling and Coercivity Modifications in Annealed or Ion-Irradiated Ir−Mn / Fe /
Salazar
¹
,
Pereira
²
,
Grande
³

et al. 2018
Phys. Rev. Applied
3
0
1
0
View full text Add to dashboard Cite

Contact Info

Product

Resources

About

FMR investigations of exchange biased NiFe/IrMn/NiFe trilayers with high and low Ni relative content

Cited by 12 publications

References 14 publications

Effect of External Factors on the Ferromagnetic Resonance Line Width in Exchange-Biased Structures

Effect of External Factors on the Ferromagnetic Resonance Line Width in Exchange-Biased Structures

Влияние Внешних Факторов На Ширину Линии Ферромагнитного Резонанса В Структурах С Обменным Смещением

Unveiling the Mechanisms Governing the Exchange Coupling and Coercivity Modifications in Annealed or Ion-Irradiated Ir−Mn / Fe / Salazar1, Pereira2, Grande3 et al. 2018Phys. Rev. Applied3010View full textAdd to dashboardCite

Contact Info

Product

Resources

About

Unveiling the Mechanisms Governing the Exchange Coupling and Coercivity Modifications in Annealed or Ion-Irradiated Ir−Mn / Fe /
Salazar
¹
,
Pereira
²
,
Grande
³

et al. 2018
Phys. Rev. Applied
3
0
1
0
View full text Add to dashboard Cite