Flying wire beam profile monitors at the KEK PS main ring

Igarashi, S.; Arakawa, Dai; Koba, K.; Sato, Hikaru; Toyama, T.; Yoshii, M.

doi:10.1016/s0168-9002(01)01515-7

Cited by 8 publications

(4 citation statements)

References 1 publication

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“…Transverse profile of a particle beam can be obtained in a number of ways. Most commonly used methods include wire scanners [1,2], gas ionization methods [3], silicon detectors [4], laser wires [5], and so on. Some of them extract a portion of the beam for sampling, while others rely on secondary effects like ionization of a residual or injected gas on the beam path.…”

Section: Introductionmentioning

confidence: 99%

Machine learning assisted non-destructive transverse beam profile imaging

Omarov¹,

Hacıömeroğlu²

2020

Preprint

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We present a non-destructive beam profile imaging concept that utilizes machine learning tools, namely genetic algorithm with a gradient descent-like minimization. Electromagnetic fields around a charged beam carry information about its transverse profile. The electrodes of a stripline-type beam position monitor (with eight probes in this study) can pick up that information for visualization of the beam profile. We use a genetic algorithm to transform an arbitrary Gaussian beam in such a way that it eventually reconstructs the transverse position and the shape of the original beam. The algorithm requires a signal that is picked up by the stripline electrodes, and a (precise or approximate) knowledge of the beam size. It can visualize the profile of fairly distorted beams as well.

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Section: Introductionmentioning

confidence: 99%

Machine learning assisted non-destructive transverse beam profile imaging

Omarov¹,

Hacıömeroğlu²

2020

Preprint

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“…The wire scanners are used for beam monitoring at low [13][14][15], medium [16][17][18] and high energies [19,20], as well as in sources of photons [21]. During the measurement, the wire is scanned across the particle beam, while the electrical current induced by the beam [22] or the intensity of the secondary particles [23] are registered. In long linear accelerators the detector has to be placed at a very large distance from the interaction region.…”

Section: Introductionmentioning

confidence: 99%

A multi-wirescanner test setup utilizing characteristic X-rays for charged particle and photon beam diagnostics

et al. 2018

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A multi-wirescanner for diagnostics of ionizing particle beams (e.g. both non-relativistic and ultra-relativistic charged particles; X-ray and gamma photons) is proposed and discussed in the paper. The scanner is based on measurement of yield of characteristic X-rays generated during the particle interaction with the wires made of different materials. The proposed scanner is developed and tested on the beam of electrons with energy of 40 keV. The quasimonochromatic characteristic X-rays and continuous background are clearly identified. The results of measurements of the transverse size, emittance, position and direction of beam propagation are presented and discussed. K : Beam-line instrumentation (beam position and profile monitors; beam-intensity monitors; bunch length monitors); Instrumentation for particle accelerators and storage rings-high energy (linear accelerators, synchrotrons); Instrumentation for particle accelerators and storage rings-low energy (linear accelerators, cyclotrons, electrostatic accelerators) 1Corresponding author.

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“…The total beam intensity can be precisely measured by a Faraday cup [1][2][3][4][5][6] or a beam current density meter. 7 Meanwhile, the profile can be obtained by various beam monitors, such as a fixed multi-wire beam profile monitor, 8 a single-wire scanner beam profile monitor, [9][10][11][12][13][14][15][16] a scintillation screen, 17,18 a residual gas monitor. [19][20][21][22] Recently, the Faraday cup array (FCA) technique by directly measuring absolute current distribution are developed both in one dimension 23 and two dimensions, 24 with great advantage of convenience.…”

Section: Introductionmentioning

confidence: 99%

A 128-channel picoammeter system and its application on charged particle beam current distribution measurements

Liu

Xue

et al. 2015

Review of Scientific Instruments

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A 128-channel picoammeter system is constructed based on instrumentation amplifiers. Taking advantage of a high electric potential and narrow bandwidth in DC energetic charged beam measurements, a current resolution better than 5 fA can be achieved. Two sets of 128-channel strip electrodes are implemented on printed circuit boards and are employed for ion and electron beam current distribution measurements. Tests with 60 keV O(3+) ions and 2 keV electrons show that it can provide exact boundaries when a positive charged particle beam current distribution is measured.

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Flying wire beam profile monitors at the KEK PS main ring

Cited by 8 publications

References 1 publication

Machine learning assisted non-destructive transverse beam profile imaging

Machine learning assisted non-destructive transverse beam profile imaging

A multi-wirescanner test setup utilizing characteristic X-rays for charged particle and photon beam diagnostics

A 128-channel picoammeter system and its application on charged particle beam current distribution measurements

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