Fluorescence yields and Coster–Kronig probabilities for the atomic L subshells

Campbell, J. A.

doi:10.1016/s0092-640x(03)00059-7

Cited by 231 publications

(240 citation statements)

References 43 publications

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“…For the f 13 CK rate, however, the listed values in Table II differ: Our value is closer to the one reported by Chen et al [2], while the result from the work of Ref. [14] is closer to the one by Campbell [6]. To make a detailed comparison with the former work of Jitschin et al [14], data with and without electron correlation corrections [14] are also presented in the table.…”

Section: Resultssupporting

confidence: 78%

“…They are listed in the first row of Table II. For comparison, CK yields adopted in the former work [14] are listed in the second row. The theoretical predictions given by Chen et al [2], the values recommended by Campbell [6], and the semiempirical values reported by Krause [23] are also quoted. Our data for the f 12 and f 23 are in general smaller than the values from theoretical and semiempirical predictions but are consistent with the values adopted by Jitschin et al [14].…”

Section: Resultsmentioning

confidence: 91%

“…Experimental determination of the L-shell CK yields presents, however, considerable difficulties. For this reason, data are scarce and often suffer from large uncertainties [6]. To date, to determine the f 23 yields, mostly the Kα-L x-ray coincidence method [6,7] was used.…”

Section: Introductionmentioning

confidence: 99%

“…For this reason, data are scarce and often suffer from large uncertainties [6]. To date, to determine the f 23 yields, mostly the Kα-L x-ray coincidence method [6,7] was used. This technique, however, fails in the case of the L 1 -subshell CK yields due to the dipole forbidden K − L 1 radiative transition.…”

Section: Introductionmentioning

confidence: 99%

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Synchrotron-radiation-based determination of XeL-subshell Coster-Kronig yields: A reexamination via high-resolution x-ray spectroscopy

et al. 2010

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The xenon L-subshell Coster-Kronig (CK) transition yields were revisited via high-resolution measurements of the Lα 1,2 (L 3 − M 4,5 ) and Lβ 1 (L 2 − M 4 ) x-ray emission lines. The L x-ray spectra were measured employing a Johansson-type curved crystal spectrometer and energy-tunable synchrotron radiation. The CK yields were derived from the relative L x-ray intensity jumps at the L edges by fitting the fluorescence intensities as a function of the photon energy to the L-subshell photoionization cross sections. The latter were obtained from the measured L-edge photoabsorption spectrum. Values of 0.118 ± 0.029, 0.383 ± 0.037, and 0.096 ± 0.016 were found for the f 23 , f 13 , and f 12 CK yields, respectively. Thanks to high resolution, the L 1 fluorescence yield of 0.059 ± 0.002 was also determined from intensity ratios of the well-resolved Lβ 4 (L 1 − M 2 ) and Lβ 1 (L 2 − M 4 ) lines. PACS number(s): 32.70.−n, 32.80. Hd, 32.50.+d, 32.30.Rj

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Section: Resultssupporting

confidence: 78%

Section: Resultsmentioning

confidence: 91%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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Synchrotron-radiation-based determination of XeL-subshell Coster-Kronig yields: A reexamination via high-resolution x-ray spectroscopy

et al. 2010

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“…This explains why compilations or theoretical calculations rarely matches under 1 keV. Concerning the L-fluorescence yields, some review articles presented compilations of measured fluorescence yield values found in the literature [5,6] and made a critical analysis in order to propose recommended values. However, from this work it is still obvious that uncertainties are quite large and in addition values for several atomic numbers are extrapolated from the fit to other existing data, illustrating the inherent difficulties.…”

Section: Introductionmentioning

confidence: 99%

Experimental and theoretical determination of the L-fluorescence yields of bismuth

et al. 2018

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The knowledge of atomic fundamental parameters such as the mass attenuation coefficients or fluorescence yields with low uncertainties, is of decisive importance in elemental quantification involving x-ray fluorescence analysis techniques. For example, several databases giving the mass attenuation coefficients are accessible and frequently used within a large community of users. These compilations are most often in good agreement for photon energies in the hard x-ray ranges. However, they significantly differ for low photon energies and around the absorption edges of the elements. Some review articles present compilations of measured fluorescence yields values found in the literature. However reliable measurements are not so many illustrating the inherent difficulties. Mass attenuation coefficients of bismuth were determined experimentally in the photon energy range from 100 eV to 30 keV by using monochromatized synchrotron radiation at SOLEIL (France). The fluorescence yields of the three L-subshells of bismuth were also determined using a reflection geometry setup. The application of high-accuracy experimental techniques resulted in low uncertainty mass attenuation coefficients and L-subshell fluorescence yields that are directly compared to existing databases and with updated relativistic configuration mixing Dirac-Fock calculations including QED corrections.

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Particle‐InducedX‐Ray Emission

Reis¹,

Campbell²

2012

Characterization of Materials

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Particle‐Induced X‐Ray Emission (PIXE) is an analytical technique established in the decade of 1970s, which makes use of MeV ion beams (mainly proton beams) to induce x‐ray emission from materials. It is used both in macro mode, where beam spots are of the order of millimeters, and in micro mode, where ion beams are focused to micrometer size (or even below this, since 100 nm spots are already available for PIXE). It has major advantages for the analysis of sensitive and/or complex samples because it is essentially a non‐destructive technique. For example, some laboratories are equipped with facilities where the beam is extracted into the atmosphere, allowing the analysis of paintings and other cultural heritage samples. Recent developments also make possible the analysis of samples that are not homogeneous but composed of different layers. In this case, PIXE has large advantages relative to electron microprobe analysis (EPMA) because the particle beam scattering is very small, such that the micro‐beam remains focused along several micrometers into the sample. Finally, the use of x‐ray detection systems having high resolution (resolving power of the order of 100 or more) is presently moving from pure fundamental work towards applications as more complex samples need to be analyzed.

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Fluorescence yields and Coster–Kronig probabilities for the atomic L subshells

Cited by 231 publications

References 43 publications

Synchrotron-radiation-based determination of XeL-subshell Coster-Kronig yields: A reexamination via high-resolution x-ray spectroscopy

Synchrotron-radiation-based determination of XeL-subshell Coster-Kronig yields: A reexamination via high-resolution x-ray spectroscopy

Experimental and theoretical determination of the L-fluorescence yields of bismuth

Particle‐InducedX‐Ray Emission

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