2021
DOI: 10.1016/j.ijft.2021.100124
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Flow analysis of a front opening unified pod (FOUP) subjected to different fan filter unit (FFU) coverage area in mini-environment

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Cited by 8 publications
(1 citation statement)
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“…It is a transport unit preventing wafers from long-term exposure to the clean-room environment during manufacturing. AMCs are likely to combine with the oxygen and water vapor in the air and adhere to wafer surfaces, influencing the yield [3][4][5][6]. Khoo et al indicated that the water vapor content in FOUP is an index for influences on the wafer process yield control.…”
Section: Introductionmentioning
confidence: 99%
“…It is a transport unit preventing wafers from long-term exposure to the clean-room environment during manufacturing. AMCs are likely to combine with the oxygen and water vapor in the air and adhere to wafer surfaces, influencing the yield [3][4][5][6]. Khoo et al indicated that the water vapor content in FOUP is an index for influences on the wafer process yield control.…”
Section: Introductionmentioning
confidence: 99%