2008
DOI: 10.1016/j.apm.2007.04.002
|View full text |Cite
|
Sign up to set email alerts
|

Flexible software reliability growth model with testing effort dependent learning process

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

0
33
0

Year Published

2017
2017
2021
2021

Publication Types

Select...
4
2
1

Relationship

0
7

Authors

Journals

citations
Cited by 74 publications
(34 citation statements)
references
References 11 publications
0
33
0
Order By: Relevance
“…Early researches related SRGM with respect to testing time [3,17]. However, incorporation of testing resources leads to development of more accurate SRGMs [4,5,9,26]. The reason being, the detection of faults are more intimately linked to the amount of resources expended [18,24] on testing as it includes-(a) Manpower, that takes into account  Testing group (malfunction recognition personnel).…”
Section: 'Bmentioning
confidence: 99%
See 1 more Smart Citation
“…Early researches related SRGM with respect to testing time [3,17]. However, incorporation of testing resources leads to development of more accurate SRGMs [4,5,9,26]. The reason being, the detection of faults are more intimately linked to the amount of resources expended [18,24] on testing as it includes-(a) Manpower, that takes into account  Testing group (malfunction recognition personnel).…”
Section: 'Bmentioning
confidence: 99%
“…They established that both exponential-type and S-type NHPP models can come under ideal and imperfect debugging situations. Later, Kapur et al [9] deliberated on the testing resource reliant learning process and classified faults into two types on the source of amount of testing resources needed to remove them. This paper models fault exclusion rate in terms of testing resource.…”
Section:  Debugging Group (Programmers\failure Rectification Personnmentioning
confidence: 99%
“…The effort based SRGMs proposed in the past use exponential, Rayleigh, logistic, or Weibull distributions to specify testing effort function (TEF) to denote effort consumption during testing [11][12][13]. Although these functions seem to give good result and can well fit in some cases, there is a fallacy in assuming finite total test effort at an infinite time.…”
Section: Introductionmentioning
confidence: 99%
“…Some SRGMs have been proposed with testing effort function (TEF) [11][12][13], since the fault detection and correction depend on efforts consumed such as test cases executed, man-days expended, computer utilization time, and other resources consumed, rather than only testing time or calendar time. The effort based SRGMs proposed in the past use exponential, Rayleigh, logistic, or Weibull distributions to specify testing effort function (TEF) to denote effort consumption during testing [11][12][13].…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation