2019 IEEE International Symposium on Hardware Oriented Security and Trust (HOST) 2019
DOI: 10.1109/hst.2019.8741025
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FLATS: Filling Logic and Testing Spatially for FPGA Authentication and Tamper Detection

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Cited by 8 publications
(4 citation statements)
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“…The work relies on the attack being unable to identify which portion of the FPGA will be utilized correctly. In [8], the authors fill the partial utilized LUTs for built-in self-test and tampering detection. Trojan detection schemes aim to identify malicious logic using run-time detection or static analysis.…”
Section: B Fpga Trojan Countermeasuresmentioning
confidence: 99%
See 1 more Smart Citation
“…The work relies on the attack being unable to identify which portion of the FPGA will be utilized correctly. In [8], the authors fill the partial utilized LUTs for built-in self-test and tampering detection. Trojan detection schemes aim to identify malicious logic using run-time detection or static analysis.…”
Section: B Fpga Trojan Countermeasuresmentioning
confidence: 99%
“…However, solutions that insert dummy logic in partially used LUTs with no effect on the output [6] may be easily identified and removed. More appropriate solutions for using partially utilized LUTs will make the output a function of all inputs [5] or include a self-test suite with expected responses [8] which will make removal more difficult. We note that these solutions would need to be extended for other exploitable primitives.…”
Section: B Countermeasuresmentioning
confidence: 99%
“…It has been shown that the key used for encrypting the bitstream on recent SRAM-based FPGAs can be extracted using SCA techniques [3]- [6]. With the extracted key at hand, the bitstream can be decrypted, modified, and stored as a replacement for the original bitstream [17]. Although bitstream extraction from flash-based FPGAs might not be possible, the adversary could still be able to reprogram certain parts of the configuration or even replace the entire chip containing her malicious version of the design.…”
Section: Introductionmentioning
confidence: 99%
“…For instance, photon emission (PE) analysis can be used to compare dynamic and static emissions with the chip layout [16] or emissions from a golden chip [15]. Furthermore, adding oscillators with inputs from the design that act as beacons can facilitate the detection of tampering attempts, especially when cheaper infrared imaging is used [17]. However, such an approach increases the resource consumption of the design considerably in many cases and might not be able to detect all possible changes in LUT configurations.…”
Section: Introductionmentioning
confidence: 99%