2007 16th IEEE International Pulsed Power Conference 2007
DOI: 10.1109/ppps.2007.4651823
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Flash X-ray diffraction system for fast, single-pulse temperature and phase transition measurements

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“…This effect is caused by the increase in the random displacement of the individual atoms from their exact geometric lattice site, which also results in an increase in the observed incoherently scattered background ( James, 1982). Single-pulse XRD bench-top laboratory measurements of this effect have been reported (Morgan, 2007), leading to the possibility that single-pulse XRD could be useful as a dynamic temperature diagnostic. Coherent scattering from atomic centers in a solid-state lattice results in diffraction lines, which are observed at angles for which the difference in path lengths is an integral number of wavelengths.…”
Section: Fy 2010 Materials Studies and Techniquesmentioning
confidence: 99%
“…This effect is caused by the increase in the random displacement of the individual atoms from their exact geometric lattice site, which also results in an increase in the observed incoherently scattered background ( James, 1982). Single-pulse XRD bench-top laboratory measurements of this effect have been reported (Morgan, 2007), leading to the possibility that single-pulse XRD could be useful as a dynamic temperature diagnostic. Coherent scattering from atomic centers in a solid-state lattice results in diffraction lines, which are observed at angles for which the difference in path lengths is an integral number of wavelengths.…”
Section: Fy 2010 Materials Studies and Techniquesmentioning
confidence: 99%
“…To extract information from X-ray diffraction intensity, it is important to take the Debye-Waller factor into account. One application of extracting information from X-ray diffraction intensity is the well known Rietveld method (Cuesta et al, 2015); another is the method of estimating the crystal temperature of a shocked crystal, proposed by Morgan et al (2007).…”
Section: Introductionmentioning
confidence: 99%