First Symposium for Reliability in Multilayer Ceramic Capacitors

Abstract

On May 11-12, 1989, the first Symposium for Reliability of Multilayer Ceramic Capacitors was held on the University Park Campus of The Pennsylvania State University. Reliability has been definedl.2 as "the probability that a product or device will perform a specified function, under a set of external conditions for a specified period of time." We may also think of reliability as the timebased concept of quality. The subject can involve complicated discussions of probability and statistics, which are crucial to its complete understanding and utilization, but that was not the main intent of the symposium. Indeed, we sought, rightly or wrongly, to emphasize the more practical aspects of reliability in place of its mathematical foundations. For a treatment of these important fundamentals the reader is referred to several recent texts and articles.3-14As all devices-from computers to automobiles-become more complex, manufacturers are demanding ever higher reliability from conventional electronic components. Just as quality requirements are exceeding the ability of producers to supply direct statistics,15 reliabilities are being requested that specify times which may exceed any ability for direct test. Defining, measuring, and guaranteeing reliability requires improved testing methods that properly simulate use stresses in reasonable time frames. Meeting ever more stringent demands requires improved understanding of the relationship between materials processing and the performance of the product under use conditions. Absolute improvements in reliability can only come from a detailed understanding of the physical and chemical processes that contribute to degradation and failure.We sought to stress these topics during the symposium. Most of the papers were by invitation of the technical committee. It is the nature of reliability to be a sensitive topic among industrial participants. This can be seen in the controversy over the applicability of many military specifications and also in the justification and methods for accelerated testing. It is unfortunate that several potential presenters could not participate in the symposium because their data could not be cleared in time by company or military reviewers. We hope that the 1989 symposium will stimulate further advances in the field and encourage everyone to participate in the next meeting. standards of ACerS. The speakers whose busy schedules did not permit the extensive work required to convert their presentations into scientific papers are encouraged to publish them as soon as possible. Attendees were all asked for their comments on this conference and their responses were such that we could not discount a single paper.Many authors and attendees have asked when the next symposium will be held. This is a question we began to discuss even before the first one took place. Certainly, the excellent attendance and the great encouragement from both industry and academic participants would favor another symposium in the near future. Recently, however, it was decided that a me...

Influence of Electroless Nickel Plating on Multilayer Ceramic Capacitors and the Implications for Reliability in Multilayer Ceramic Capacitors

“…T HE reliability of multilayer ceramic capacitors (MLCs) is a topic of practical importance. 1 Capacitor failures account for the majority of circuit failures in modern electronic equipment. Failure and degradation occur in MLCs in use, in testing, and even in the process of manufacturing.…”