2021
DOI: 10.1038/s41524-021-00562-0
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First-principles prediction of electronic transport in fabricated semiconductor heterostructures via physics-aware machine learning

Abstract: First-principles techniques for electronic transport property prediction have seen rapid progress in recent years. However, it remains a challenge to predict properties of heterostructures incorporating fabrication-dependent variability. Machine-learning (ML) approaches are increasingly being used to accelerate design and discovery of new materials with targeted properties, and extend the applicability of first-principles techniques to larger systems. However, few studies exploited ML techniques to characteriz… Show more

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Cited by 21 publications
(19 citation statements)
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“…36 We illustrated in our previous publications that the layer compositions and external substrate induced strains prompt non-uniform monolayer separations, and modulate the Seebeck coefficients of Si/Ge SLs, within the CRTA. [35][36][37][38] Here, we highlight the effect of EPS and IMS processes on the Seebeck coefficients, resistivities, and power-factors of these Si/Ge SLs in diverse strain environments. We also discuss how these predictions compare with the DOS scattering approximation and CRTA (ESI, † Fig.…”
Section: Resultsmentioning
confidence: 98%
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“…36 We illustrated in our previous publications that the layer compositions and external substrate induced strains prompt non-uniform monolayer separations, and modulate the Seebeck coefficients of Si/Ge SLs, within the CRTA. [35][36][37][38] Here, we highlight the effect of EPS and IMS processes on the Seebeck coefficients, resistivities, and power-factors of these Si/Ge SLs in diverse strain environments. We also discuss how these predictions compare with the DOS scattering approximation and CRTA (ESI, † Fig.…”
Section: Resultsmentioning
confidence: 98%
“…Previous first-principles studies did not include the effect of energy dependent electron relaxation times on the electronic transport properties of SLs. 33,[36][37][38] We also discuss how these predictions change when different scattering approximations, such as constant relaxation time and DOS scattering approximations, are used. We investigate two classes of short-period Si/Ge SLs in diverse lattice strain environments: SLs with varied layer compositions grown on identical substrates and SLs with identical compositions but grown on different substrates.…”
Section: Summary and Discussionmentioning
confidence: 99%
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