“…The nature of these processes calls for further investigations (oxygen vacancies moving, traps filling, electric charge hopping, interfacial polarization, etc.). 6,11,12,15,[23][24][25][26][27] In conclusion, we consider estimation of the steady-state ("true") leakage current in polycrystalline PZT thin films using the voltage-step technique by CvS and Σexp models. The Σexp model provides good accuracy of the steady-state leakage current J s determination at reduced measurement time that is important to avoid film degradation.…”