First-Order Optical Design for Fourier Spectrometers

Breckinridge, James B.; Schindler, R. A.

doi:10.1016/b978-0-12-710402-7.50008-3

Cited by 4 publications

(2 citation statements)

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“…He wrote a ray-trace program for end-to-end modeling of the polarization properties of optical wavefronts within reflecting and refracting broadband, ''white-light'' remote sensing instruments and telescopes. An earlier version of this modeling tool was used by Breckinridge & Schindler (1981) to ray trace the polarization properties of Fourier Transform Spectrometers.…”

Section: Prior Research On Astronomical Mirrormentioning

confidence: 99%

Polarization Effects in Reflecting Coronagraphs for White‐Light Applications in Astronomy

Breckinridge

Oppenheimer

2004

ApJ

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The properties of metal thin films have been largely overlooked in discussions of the technical limitations and problems that arise in the field of direct detection of exoplanets. Here, polarization properties and anisotropy properties of highly reflecting thin metal films are examined within the context of the requirements for the ultralow-scattered-light system performance of coronagraphs applied to space and ground-based high-contrast, whitelight astronomy. Wavelength-dependent optical constants for highly reflecting thin metal films, taken from the literature, are used to calculate the polarization-dependent transmissivity of a typical coronagraph. The effects of degraded performance on the astronomical science are examined. Suggestions are made for future work.

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Section: Prior Research On Astronomical Mirrormentioning

confidence: 99%

Polarization Effects in Reflecting Coronagraphs for White‐Light Applications in Astronomy

Breckinridge

Oppenheimer

2004

ApJ

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“…Following the earlier work of Breckinridge and Schindler (1981) we develop resolution trade-offs for hyperspectral instruments, and then apply our analysis to hyperspectral scenarios. Fourier transform spectrometers are used for most ultraspectral instruments because of the required very high spectral resolution, the infrared spectral region (2 to 16 micrometers) and the typically very low energy from the source.…”

Section: Spie Vol 2819/3mentioning

confidence: 99%

<title>Evolution of imaging spectrometry: past, present, and future</title>

Breckinridge

1996

SPIE Proceedings

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An overview of the physical principals of imaging spectrometry for detailed characterization of remote objects and of gas vapors is given. The terms Multi-spectral, Hyperspectral, and Ultra-spectral are defined within the framework of applications and instrument system design approaches. History of the development of imaging spectrometers is reviewed. We are at the threshold of major commercial efforts for these instrument systems.

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