2001
DOI: 10.1016/s0168-9002(01)00409-0
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First commissioning results for the elliptically polarizing undulator beamline at the Advanced Light Source

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Cited by 40 publications
(18 citation statements)
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“…Examples include conductive polymers for organic electronics and structural anisotropy in membrane materials for gas separation. Beamline 4.0.2 is optimized for magnetic spectroscopy 32 and provides a high flux of nearly 10 12 photons/second. It is equipped with an Apple-II Elliptical Polarizing undulator 33 for various X-ray polarizations including linear s and p and provides a free beam port that can accommodate mobile user instruments such as the UHV scattering chamber developed and operated by J.…”
Section: Discussionmentioning
confidence: 99%
“…Examples include conductive polymers for organic electronics and structural anisotropy in membrane materials for gas separation. Beamline 4.0.2 is optimized for magnetic spectroscopy 32 and provides a high flux of nearly 10 12 photons/second. It is equipped with an Apple-II Elliptical Polarizing undulator 33 for various X-ray polarizations including linear s and p and provides a free beam port that can accommodate mobile user instruments such as the UHV scattering chamber developed and operated by J.…”
Section: Discussionmentioning
confidence: 99%
“…The experiment was performed at Bl 4.0 [10] of the Advanced Light Source using the COLTRIMS technique (Cold Target Recoil Ion Momentum Spectroscopy) [11]. The photon beam intersected a supersonic molecular gas jet.…”
mentioning
confidence: 99%
“…polarization vector of the linearly polarized light was rotated in steps of 10 deg from parallel to perpendicular to the spectrometer axis [10] has been performed. By this rotation of the polarization vector we collected a data set which covers all directions of the molecular axis and the Auger electron with respect to the polarization and to each other.…”
mentioning
confidence: 99%
“…Near edge X-ray absorption fine structure (NEXAFS) spectroscopy measurements at Ce M 4,5 and C K absorption edges on weathered CePO 4 ÁH 2 O samples in the absence or presence of catechol and dissolved oxygen were conducted on beamline 4.0.2 at the Advanced Light Source, Lawrence Berkeley National Laboratory (Young et al, 2001). The spectroscopic data were obtained by scanning the X-ray energy through the Ce M 4,5 edges with an approximate energy resolution of 0.2 eV and measuring the absorption signal through the total electron yield (TEY) with a channeltron electron-multiplier.…”
Section: X-ray Spectroscopy and Spectromicroscopymentioning
confidence: 99%