Current-voltage (I-V ) characteristics of Tl2Ba2CaCu2O8 thin films in zero magnetic field are measured and analyzed with the conventional Kosterlitz-Thouless-Berezinskii (KTB) approach, dynamic scaling approach and finite-size scaling approach, respectively. It is found from these results that the I-V relation is determined by the vortex-unbinding mechanism with the KTB dynamic critical exponent z = 2. On the other hand, the evidence of finite-size effect is also found, which blurs the feature of a phase transition.