2008
DOI: 10.1109/pvsc.2008.4922860
|View full text |Cite
|
Sign up to set email alerts
|

Final results from the MISSE5 GaAs on Si solar cell experiment

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1

Citation Types

0
3
0

Year Published

2010
2010
2021
2021

Publication Types

Select...
2
2

Relationship

0
4

Authors

Journals

citations
Cited by 4 publications
(3 citation statements)
references
References 2 publications
0
3
0
Order By: Relevance
“…The PEC was attached to the ISS and opened in orbit to expose the FTSCE and other experiments (see Figure 5). At the end of the mission, the PEC was closed and returned to Earth for further investigation [21][22][23][24][25][26][27]. Two FTSCE missions have been completed and FTSCE III is presently in orbit.…”
Section: Space Solar Cell Experimentsmentioning
confidence: 99%
See 1 more Smart Citation
“…The PEC was attached to the ISS and opened in orbit to expose the FTSCE and other experiments (see Figure 5). At the end of the mission, the PEC was closed and returned to Earth for further investigation [21][22][23][24][25][26][27]. Two FTSCE missions have been completed and FTSCE III is presently in orbit.…”
Section: Space Solar Cell Experimentsmentioning
confidence: 99%
“…The FTSCE platform has included a wide range of solar cell technologies such as state-of-the-art triple junction InGaP/GaAs/Ge solar cells from several vendors, thin film amorphous Si and CuIn(Ga)Se2 cells. Also single-junction GaAs cells grown on Si wafers, thin film GaAs cells as well as metamorphic and inverted multi-junction (IMM) cells were tested [21][22][23][24][25][26][27]. The data were continuously telemetered to the Earth.…”
Section: Space Solar Cell Experimentsmentioning
confidence: 99%
“…This epilayer was used as the starting point for the deposition of the III–V junctions in the 3J PV cell. Unfortunately, the thermal strain accumulated in the whole stack (SiGe + III–Vs) is more than sufficient to generate a significant substrate bowing and several microcracks in the active layers, to such an extent that cell efficiency drops at the end of cell life . In particular, cracks are randomly created because of temperature oscillations occurring during regular operation of the devices, both in concentrated terrestrial and in space conditions, and because of mechanical stresses.…”
Section: Introductionmentioning
confidence: 99%