SummaryThe method for imaging of highly sensitive nanostructures unstable under electron beam irradiation is introduced. To reduce charge and thermally generated beam damage, highly conductive multilayered graphene or thin graphite layers were used as supports for nanostructures. Well-defined crystalline structure of graphite layers enables image reconstruction by Fourier filtering and allows maintaining high quality of images. The approach was tested for imaging of highly sensitive quasi one-dimensional SnTe nanocrystals hosted inside single-walled carbon nanotubes. Relying on the filtered images and the image simulation, the structure of onedimensional SnTe was established as a chain of fcc NaCl type unit cells, connected by the [001] edges with <110> direction coinciding with nanotube axis.Filled single-walled carbon nanotubes (SWNTs) are intensively explored field of research. The progress in this field is considered in a recent review by Sloan and Monthioux (2012). Electron microscopy of 1Dcrystal@SWNT is commonly accompanied by beam induced damage of the SWNT due to knock-on effect (Zobelli et al., 2008) and the one-dimensional crystals due to effective heating or charging by an electron beam (Hutchison et al., 2008).Recently, some progress has been achieved in this field by lowering an accelerating voltage of electron microscopes down to 30-60 keV with simultaneous c s correction which allows maintaining adequate resolution of the images (Kaiser, 2010;Kiselev et al., 2012). However, an effective study of the composites with low binding energies still remains a challenging task.Correspondence to: N.A. Kiselev,