Electrostatic discharge (ESD) on the metallic enclosure of electronic products normally generates unwanted radiated electromagnetic interference (EMI).
INTRODUCTIONESD is a transfer of electric charges between bodies of different electrostatic potential in proximity or through direct contact [1]. It can cause permanent damage and signal errors to high-speed electronic circuitries. When ESD is directly discharged on the metallic plane, a large magnitude of radiated field will be generated [2][3][4]. For physical protection in practice as well as EMI shielding purposes, a metallic enclosure is normally used to cover the internal circuitries of the electronic products. However, an aperture created on the metallic enclosure for heat dissipation or cable connection, would usually degrade the overall shielding effectiveness.ESD current diffusion and EM field radiation on the metallic enclosure were carried out by Angeli et al. by using the finitedifference (FD) method in both the time domain and the frequency domain [5][6]. ESD field penetration into an enclosure through slots has also discussed by Cerri et al. [7][8][9][10]. The ESD indirect coupling mechanism was studied by using an analytical approach based on the classical electromagnetic theory [11]. The abovementioned references of previous research found good agreement between the various experimental and mathematical models and their results indicated that the noise coupled into the metallic enclosure was significant. In this paper, we study the noise level induced within a metallic enclosure due to: (i) different aperture lengths on the metallic enclosure, and (ii) different injection locations of ESD on a metallic enclosure with an aperture by using an experimental approach.
GEOMETRY OF THE METALLIC ENCLOSURE OF THE MEASUREMENTThe configuration of the metallic enclosure in our study is shown in Figure 1. A 3-mm-thick aluminum (Al) metallic enclosure with a dimension of 20 cm ϫ 30 cm ϫ 50 cm, which is the typical size of computer casing, is used in the analysis of this paper. There is an aperture on the enclosure representing the common slot opening on the casing. To simplify our analysis, the aperture is placed only on one of the plane of the metallic enclosure. A 4 cm ϫ 4 cm square loop is also placed inside the metallic enclosure at point X to pick up the induced noise voltage level inside the enclosure.
MEASUREMENT SETUPThe arrangement of the measurement set-up is shown in Figure 2.To provide an environment that is free from all external EM noise, all the measurements are carried out inside an anechoic chamber. A digital oscilloscope and an attenuator are placed outside the chamber in order to avoid the unwanted triggers caused due to the high level of EM field generated by the ESD current. A commercial ESD-simulator, KeyTak model MINIZAP MZ-15/EC, is used to generate the required electrostatic discharge in our measurement. A typical ESD current is injected into the metallic enclosure at point S. This is to model the situation of a person touch...