“…1. Individual device metering (e.g., Cheung et al 2012, Mercier & Moorefield 2011, Moorefield & Calwell 2011, Bensch et al 2010, Meier et al 2008, Porter et al 2006, Nordman & McMahon 2004, McWhinney et al 2004), 2. Representative surveys (e.g., Strack 2012, EIA 2009, 3.…”