Field-assisted oxygen etching for sharp field-emission tip

Rahman, F.; Onoda, Jo; Imaizumi, Koji; Mizuno, Seigi

doi:10.1016/j.susc.2008.04.034

Cited by 39 publications

(34 citation statements)

References 22 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…3d. Previously, individual atoms of a trimer and very small atomic planes on ultra sharp tips from W(1 1 1) crystals have also been reported by other researches [6,7,23].…”

Section: Experiment Results and Discussionmentioning

confidence: 54%

Confinement of the field electron emission to atomic sites on ultra sharp tips

2009

View full text Add to dashboard Cite

“…3d. Previously, individual atoms of a trimer and very small atomic planes on ultra sharp tips from W(1 1 1) crystals have also been reported by other researches [6,7,23].…”

Section: Experiment Results and Discussionmentioning

confidence: 54%

Confinement of the field electron emission to atomic sites on ultra sharp tips

2009

View full text Add to dashboard Cite

“…Over the next two decades, the blown‐glass FIM was replaced with an all‐metal apparatus (Ryan and Suiter, ), and researchers tried new gases such as neon (Nishikawa and Müller, ), and new emitter materials such as gold (Averback and Seidman, ). To this day, the basic FIM remains a valuable instrument to scientists for observing or controlling the end shape of a needle with atomic precision (Rezeq et al ., ; Rahman et al ., ) and for studying atomic processes that occur at surfaces (Kellogg, ).…”

Section: The Field Ion Microscopementioning

confidence: 99%

The history and development of the helium ion microscope

Economou¹,

Notte²,

Thompson³

2011

Scanning

View full text Add to dashboard Cite

The helium ion microscope has recently emerged as a commercially available instrument. However, its roots go back more than 60 years to the development of the field ion microscope in Berlin, first reported in 1951. Over the intervening years, numerous researchers have pursued the development of a gas field ionization source with the goal of producing a suitable source for an ion microscope. This proved to be an elusive goal until early in this century when a number of discoveries led to a successful source, and shortly thereafter, an instrument fully able to exploit its advantages. Many individuals and many technical advances have come together to make this new class of microscope. The long history of this quest is reviewed along with the recent advances that led to the achievement of this milestone. A brief summary of the current status of the technology and its applications are given.

show abstract

“…Rahman et al have shown the oxygen etching of W(111) oriented tips, but did not discuss the details of single atom tip formation and reformation after tip destructions. 19 Tungsten (310) oriented wire has also been shown to produce SATs using the etching method but does not provide the symmetry of the (111) oriented crystals. 20 In this article, we show the exacting process a) Electronic mail: jason.pitters@nrc-cnrc.gc.ca.…”

Section: Introductionmentioning

confidence: 99%

Creation and recovery of a W(111) single atom gas field ion source

Pitters

Urban

Wolkow

2012

The Journal of Chemical Physics

View full text Add to dashboard Cite

Tungsten single atom tips have been prepared from a single crystal W(111) oriented wire using the chemical assisted field evaporation and etching method. Etching to a single atom tip occurs through a symmetric structure and leads to a predictable last atom unlike etching with polycrystalline tips. The single atom tip formation procedure is shown in an atom by atom removal process. Rebuilds of single atom tips occur on the same crystalline axis as the original tip such that ion emission emanates along a fixed direction for all tip rebuilds. This preparation method could be utilized and developed to prepare single atom tips for ion source development.

show abstract

Field-assisted oxygen etching for sharp field-emission tip

Cited by 39 publications

References 22 publications

Confinement of the field electron emission to atomic sites on ultra sharp tips

Confinement of the field electron emission to atomic sites on ultra sharp tips

The history and development of the helium ion microscope

Creation and recovery of a W(111) single atom gas field ion source

Contact Info

Product

Resources

About