FIB Lift-Out Specimen Preparation Techniques

Giannuzzi, Lucille A.; Kempshall, Brian W.; Schwarz, Stephen; Lomness, Janice K.; Prenitzer, B. I.; Stevie, F. A.

doi:10.1007/0-387-23313-x_10

Cited by 129 publications

(134 citation statements)

References 36 publications

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“…The number density and the average size of secondary precipitates were measured from the obtained micrographs using a grey scale segmentation method. Thin-foil specimens were prepared using a FIB-based lift-out technique [34] [35,36]. The chemical composition of precipitates was also analysed using Energy Dispersive X-ray spectroscopy (EDX) with an Oxford Instruments X-Max 80 N TLE EDX system in the same TEM system at an accelerating voltage of 200 kV.…”

Section: Materials and Experimental Methodsmentioning

confidence: 99%

Investigation of short-term creep deformation mechanisms in MarBN steel at elevated temperatures

Benaarbia

Sun

et al. 2018

Materials Science and Engineering: A

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This paper reports the short-term creep behaviour at elevated temperatures of a MarBN steel variant. Creep tests were performed at three different temperatures (625°C, 650°C and 675°C) with applied stresses ranging from 160 MPa to 300 MPa, and failure times from 1 to 350 h. Analysis of the macroscopic creep data indicates that the steady-state creep exhibits a power-law stress dependence with an exponent of 7 and an activation energy of 307 kJ mol, suggesting that dislocation climb is the dominant rate-controlling creep mechanism for MarBN steel. Macroscopic plastic instability has also been observed, highlighted by an obvious necking at the rupture region. All the macroscopic predictions have been combined with microstructural data, inferred from an examination of creep ruptured samples, to build up relations between macroscopic features (necking, damage, etc.), and underlying microstructural mechanisms. Analysis of the rupture surfaces has revealed a ductile fracture mode. Electron Backscatter Diffraction (EBSD) analysis near to the rupture surface has indicated significant distortion and refinement of the original martensitic substructure, which is evidence of long-range plastic flow. Dislocation pile-ups and tangles from TEM were also observed near substructure boundaries and precipitate particles. All of these microstructural observations suggest that creep is influenced by a complex interaction between several elements of the microstructure, such as dislocations, precipitates and structure boundaries. The calculated stress exponent and activation energy have been found to agree quantitatively with the highlighted microstructural features, bearing some relationships to the true observed creep microstructures.

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Section: Materials and Experimental Methodsmentioning

confidence: 99%

Investigation of short-term creep deformation mechanisms in MarBN steel at elevated temperatures

Benaarbia

Sun

et al. 2018

Materials Science and Engineering: A

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“…93 EXLO is also appropriate where manipulation of an electron transparent specimen to an S/TEM microelectromechanical system carrier device is required (as shown in Figure 7b ), since this avoids the FIB imaging and potential ion implantation damage that can occur to the specimen during INLO. Recent advances in EXLO include a new grid design and method that negates the need for a carbon fi lm and allows for further FIB milling or other processing after lift-out.…”

Section: Recent Advances In S/tem Specimen Preparationmentioning

confidence: 99%

Recent advances in focused ion beam technology and applications

Bassim

Scott

Giannuzzi³

2014

MRS Bull.

130

102

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Focused ion beam microscopes are extremely versatile and powerful instruments for materials research. These microscopes, when coupled in a system with a scanning electron microscope, offer the opportunity for novel sample imaging, sectioning, specimen preparation, threedimensional (3D) nano-to macroscale tomography, and high resolution rapid prototyping. The ability to characterize and create materials features in a site-specifi c manner at nanoscale resolution has provided key insights into many materials systems. The advent of novel instrumentation, such as new ion sources that encompass more and more of the periodic table, in situ test harnesses such as cryogenic sample holders for sensitive material analyses, novel detector confi gurations for 3D structural, chemical, and ion contrast characterization, and robust and versatile process automation capabilities, is an exciting development for many fi elds of materials research.

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“…After, the foil is deposited with a micromanipulator in an adequate substrate and is ready for analysis [39]. This procedure is known as FIB/lift-out preparation, and is often found related with SEM and TEM ex-situ analysis [40]. On the other hand, the FIB technique can be also used for site-specific in-situ analyses.…”

Section: Focused Ion Beammentioning

confidence: 99%