2022
DOI: 10.1088/1361-6501/ac8368
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Few shot cross equipment fault diagnosis method based on parameter optimization and feature mertic

Abstract: With the rapid development of industrial informatization and deep learning technology, modern data-driven fault diagnosis (MIFD) methods based on deep learning have been continuously emphasized by the industry. However, most of these methods require sufficient training samples to achieve the desired diagnostic effect, but the scarcity of fault samples in the actual industrial environment leads to the limited development of MIFD methods. In addition, due to the changes of equipment operating conditions and prod… Show more

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Cited by 115 publications
(16 citation statements)
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“…Fourth, we explicitly omitted sources of interference in the representations of the assembly workplace with IAS to investigate its pure effect on MWC. However, interferences, such as time delays or modeling errors (Tao et al, 2022 ; Xu et al, 2021 ), can be expected to occur in operational practice in assembly process planning (Qian et al, 2023 ) when working with IAS, which could alter the experiences of workers with such systems. Depending on whether assembly workers need to fix certain malfunctions on their own, knowledge characteristics could increase by using IAS, for example, because programming skills are needed to fix interferences but are not necessary for the majority of daily assembly processes.…”
Section: Discussionmentioning
confidence: 99%
See 1 more Smart Citation
“…Fourth, we explicitly omitted sources of interference in the representations of the assembly workplace with IAS to investigate its pure effect on MWC. However, interferences, such as time delays or modeling errors (Tao et al, 2022 ; Xu et al, 2021 ), can be expected to occur in operational practice in assembly process planning (Qian et al, 2023 ) when working with IAS, which could alter the experiences of workers with such systems. Depending on whether assembly workers need to fix certain malfunctions on their own, knowledge characteristics could increase by using IAS, for example, because programming skills are needed to fix interferences but are not necessary for the majority of daily assembly processes.…”
Section: Discussionmentioning
confidence: 99%
“…In this way, the EVM study counteracts assembly process- and organization-specific effects, such as an organization’s technology-averse tendency. Third, the EVM study design allows the pure investigation of the effect of the IAS on MWC without the impact of additional interferences, such as time delays or incorrect modeling which could occur in occupational practice (Tao et al, 2022 ; Xu et al, 2021 ).…”
Section: Methodsmentioning
confidence: 99%
“…In order to determine whether workers are wearing helmets and workwear correctly, we propose a method for constructing Fig. 16 The implementation diagram of the proposed method on an offshore drilling platform. The bottom layer is the surveillance camera, which is responsible for collecting the site images; the middle layer is the server, where the model is deployed on each server and is responsible for completing the PPE detection; the top layer is the client, where the identification results of each server are aggregated to the client, which is responsible for visualizing the identification results and generating alert messages position features based on object bounding boxes.…”
Section: Discussionmentioning
confidence: 99%
“…With the continuous progress of information technology and industrial technology, modern industrial production is developing in the direction of high speed, precision and intelligence, and data-driven [16,17] abnormal event diagnosis methods are gaining more and more attention and development, including the application of visual data for PPE detection. The vision-based methods can be divided into two categories: one is the traditional method of image processing combined with machine learning [5][6][7][18][19][20]; the other is using deep learning technology, e.g., object detection [9][10][11][12][21][22][23][24][25][26][27][28].…”
Section: Literature Reviewmentioning
confidence: 99%
“…For fault diagnosis, a robust and high-accuracy classifier is required to distinguish the type of fault. For example, Tao et al [23] proposed a feature metric-based fault diagnosis approach under limited data conditions. In the study, a parametric optimization-based meta-learning network and a metric learning network were combined to extract optimization information to adapt between different domains and metric information for similarity discrimination, respectively.…”
Section: Related Workmentioning
confidence: 99%