2006
DOI: 10.1134/s0021364006120095
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Ferromagnetism in epitaxial germanium and silicon layers supersaturated with managanese and iron impurities

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Cited by 11 publications
(28 citation statements)
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“…The usual reflective x-ray and electron diffraction do not allowe to define this structure (in x-ray diffraction because of small thickness of layers and too small weight of Si atoms and in electron diffraction possibly because of masking by amorphous surface oxide layer). Here we represent new data about structure of our layers DMS Si:Mn/GaAs recently obtained with application of high resolution transmission electronic microscopy (HRTEM) and selected area electron diffraction (SAED).The PLD technology fabrication of DMS Si:Mn on single crystal GaAs substrates with (100) orientation was described in [17,18]. Measurements of cross-section HRTEM and SAED were made on JEOL device JEM-2100F.…”
mentioning
confidence: 99%
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“…The usual reflective x-ray and electron diffraction do not allowe to define this structure (in x-ray diffraction because of small thickness of layers and too small weight of Si atoms and in electron diffraction possibly because of masking by amorphous surface oxide layer). Here we represent new data about structure of our layers DMS Si:Mn/GaAs recently obtained with application of high resolution transmission electronic microscopy (HRTEM) and selected area electron diffraction (SAED).The PLD technology fabrication of DMS Si:Mn on single crystal GaAs substrates with (100) orientation was described in [17,18]. Measurements of cross-section HRTEM and SAED were made on JEOL device JEM-2100F.…”
mentioning
confidence: 99%
“…In paper 15 for layers with 0.8% peak atomic fraction of Mn the ferromagnetism, according to magnetization, was shown up to 400К. In work 16 the layers with concentration of Mn (2.7-5.9)·10 20 cm -3 showed ferromagnetism up to 305К on magnetization and Faraday effect data.The most high-temperature DMS on basis of diamondlike semiconductors GaSb, InSb, Ge and Si doped by Mn or Fe were synthesized in our laboratory by PLD [17][18] . The mainly investigated by us DMS Si:Mn with 10-15 % Mn has greatest mobility of current carriers, the Mn impurity in it shows high electric and magnetic activity.…”
mentioning
confidence: 99%
“…Via this technique, Mn doping was found to be extremely sensitive to growth conditions, particularlly to the growth temperature. Excellent work in this aspect can be found in references (Jamet et al, 2006, Ahlers et al, 2006b, Park et al, 2001, Bougeard et al, 2006, Li et al, 2007, Demidov et al, 2006, Pinto et al, 2005b. In general, at low growth temperatures (T b < 120 o C), the diffusion of Mn atoms leads to the formation of Mn-rich nanostructures, such as nanocolumns (Devillers et al, 2007) and nanodots (Bougeard et al, 2006) with irregular shapes.…”
Section: Overview Of the Mn Doped Gementioning
confidence: 99%
“…However, extensive experiments revealed that Mn-rich precipitates were developed and buried in a crystalline Ge matrix (Park et al, 2005, Lin et al, 2008, Verna et al, 2006, D'Orazio et al, 2002, Liu et al, 2004, Lifeng et al, 2004 in a much similar manner to that of the thin films grown by MBE (Park et al, 2001, Bougeard et al, 2006, Li et al, 2007, Demidov et al, 2006.…”
Section: Overview Of the Mn Doped Gementioning
confidence: 99%
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