Ferromagnetic resonance of sputtered yttrium iron garnet nanometer films

Liu, Tao; Chang, Houchen; Vlaminck, Vincent; Sun, Yonghe; Kabatek, Michael; Hoffmann, A.; Deng, Longjiang; Wu, Mingzhong

doi:10.1063/1.4852135

Cited by 144 publications

(96 citation statements)

References 33 publications

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“…Logic operations with spin waves in YIG waveguides [2,3,4], data-buffering elements [5] and magnon transistors [6] are only a few examples for the latest technology progress. Especially, YIG films of nanometer thickness [7,8,9,10,11,12] are of large importance since they allow for the realization of nano-and microstructures [6,8,13,14] and an enhancement of spin-transfer-torque related effects [12,15]. In this context the material parameters of YIG are of crucial importance for its application potential.…”

Section: Introductionmentioning

confidence: 99%

Measurements of the exchange stiffness of YIG films using broadband ferromagnetic resonance techniques

Klingler¹,

Chumak²,

Mewes³

et al. 2014

J. Phys. D: Appl. Phys.

146

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Abstract. Measurements of the exchange stiffness D and the exchange constant A of Yttrium Iron Garnet (YIG) films are presented. The YIG films with thicknesses from 0.9 µm to 2.6 µm were investigated with a microwave setup in a wide frequency range from 5 to 40 GHz. The measurements were performed when the external static magnetic field was applied in-plane and out-of-plane. The method of Schreiber and Frait [1], based on the analysis of the perpendicular standing spin wave (PSSW) mode frequency dependence on the applied out-of-plane magnetic field, was used to obtain the exchange stiffness D. This method was modified to avoid the influence of internal magnetic fields during the determination of the exchange stiffness. Furthermore, the method was adapted for in-plane measurements as well. The results obtained using all methods are compared and values of D between (5.18 ± 0.01) · 10 −17 T·m 2 and (5.34±0.02)·10 −17 T·m 2 were obtained for different thicknesses. From this the exchange constant was calculated to be A = (3.65 ± 0.38) pJ/m. arXiv:1408.5772v1 [cond-mat.mtrl-sci]

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Section: Introductionmentioning

confidence: 99%

Measurements of the exchange stiffness of YIG films using broadband ferromagnetic resonance techniques

Klingler¹,

Chumak²,

Mewes³

et al. 2014

J. Phys. D: Appl. Phys.

146

View full text Add to dashboard Cite

show abstract

“…Consequently the material is used for building delay lines, rf filters, attenuators, resonators, Y junctions and other high-frequency devices [3,4]. Studying spin wave (SW) propagation in thin YIG films and in ultrathin YIG layers has become interesting only lately since high-quality ultrathin YIG films have only become available recently using standard deposition techniques such as liquid phase epitaxy (LPE) [5,6] pulsed layer deposition (PLD) [7][8][9][10], or sputter deposition [11][12][13]. In particular, the prospect of being able to use sputter deposition, which is the industry standard for thin-film deposition of spintronics devices, to produce high-quality material makes thin YIG films an even more interesting choice for the spintronics community.…”

Section: Introductionmentioning

confidence: 99%

Magnetic properties of spin waves in thin yttrium iron garnet films

et al. 2017

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We report spin wave propagation experiments in thin yttrium iron garnet (YIG) films. Using time-resolved scanning Kerr microscopy we extract the mode structure of the spin waves. For quasi-single-mode excitation, the spin wave decay can be fitted with a damped harmonic oscillator function providing us with information about the attenuation length. We measure values of about 2.7 and 3.6 μm for the spin wave decay length of 38-and 49-nm-thick YIG samples, respectively. Micromagnetic simulations are performed to compare experimental and simulated modes. The data are in very good agreement with these simulations.

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“…These damping parameters were extracted from ferromagnetic resonance measurements at comparable resonance frequencies. [7][8][9][10][11][12][13][14][15][16] The intrinsic damping in bulk YIG has been reported to be α = 3 × 10 −5 . 17 In this study, we present PLD growth and characterization of epitaxial YIG thin films grown on Gadolinium Gallium Garnet (Gd 3 Ga 5 O 12 , GGG) substrates with saturation magnetization close to bulk and low damping parameters.…”

mentioning

confidence: 99%

Pulsed laser deposition of epitaxial yttrium iron garnet films with low Gilbert damping and bulk-like magnetization

et al. 2014

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Yttrium iron garnet (YIG, Y 3Fe5O12) films have been epitaxially grown on Gadolinium Gallium Garnet (GGG, Gd3Ga5O12) substrates with (100) orientation using pulsed laser deposition. The films were single-phase, epitaxial with the GGG substrate, and the root-mean-square surface roughness varied between 0.14 nm and 0.2 nm. Films with thicknesses ranging from 17 to 200 nm exhibited low coercivity (<2 Oe), near-bulk room temperature saturation moments (∼135 emu cm−3), in-plane easy axis, and damping parameters as low as 2.2 × 10−4. These high quality YIG thin films are useful in the investigation of the origins of novel magnetic phenomena and magnetization dynamics.

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Ferromagnetic resonance of sputtered yttrium iron garnet nanometer films

Cited by 144 publications

References 33 publications

Measurements of the exchange stiffness of YIG films using broadband ferromagnetic resonance techniques

Measurements of the exchange stiffness of YIG films using broadband ferromagnetic resonance techniques

Magnetic properties of spin waves in thin yttrium iron garnet films

Pulsed laser deposition of epitaxial yttrium iron garnet films with low Gilbert damping and bulk-like magnetization

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