2018
DOI: 10.1063/1.5030348
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Ferromagnetic Josephson junctions based on epitaxial NbN/Ni60Cu40/NbN trilayer

Abstract: We fabricated and characterized a weakly coupled magnetic Josephson junction based on epitaxial NbN/Ni60Cu40/NbN trilayer heterostructures on single crystal MgO (100) substrates. X-ray diffraction and cross-sectional scanning transmission electron microscopy were used to verify the epitaxial growth of NbN/Ni60Cu40/NbN trilayer, while the ferromagnetic properties of NiCu on NbN film were recorded by plotting the magnetization as a function of both the temperature and the magnetic field strength. The NbN/Ni60Cu4… Show more

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Cited by 6 publications
(3 citation statements)
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“…This value is higher than that extracted from the resistivity of a single Pd 89 Ni 11 film (~ 90 µΩ) 31 , which may be due to the interface resistance arising in the non-epitaxial NbN counter-layer grown on PdNi. However, this interface resistance is much smaller than that reported for NbN/CuNi/NbN junctions 32 , in which the interface resistance was seven-fold larger than the resistance extracted from the resistivity of a single CuNi film.
Figure 3 ( a ) Current–voltage characteristics of a 10 × 10 µm 2 junction with a 25-nm-thick PdNi interlayer measured at 4.2 K. ( b ) Dependence of critical currents on the thickness of the PdNi interlayer.
…”
Section: Resultscontrasting
confidence: 62%
“…This value is higher than that extracted from the resistivity of a single Pd 89 Ni 11 film (~ 90 µΩ) 31 , which may be due to the interface resistance arising in the non-epitaxial NbN counter-layer grown on PdNi. However, this interface resistance is much smaller than that reported for NbN/CuNi/NbN junctions 32 , in which the interface resistance was seven-fold larger than the resistance extracted from the resistivity of a single CuNi film.
Figure 3 ( a ) Current–voltage characteristics of a 10 × 10 µm 2 junction with a 25-nm-thick PdNi interlayer measured at 4.2 K. ( b ) Dependence of critical currents on the thickness of the PdNi interlayer.
…”
Section: Resultscontrasting
confidence: 62%
“…However, this interface resistance is much smaller than that reported for NbN/CuNi/NbN junctions 32 , in which the interface resistance was seven-fold larger than the resistance extracted from the resistivity of a single CuNi film.…”
Section: Resultscontrasting
confidence: 62%
“…[9] All of the SFS Josephson junctions reported here were fabricated in our laboratory using a process as described elsewhere. [20] The chemical stoichiometry of the The exchange energy exerted on the Cooper pair could induce a non-zero momentum center, resulting in the damped oscillation behavior of the critical current as a function of the ferromagnetic layer thickness.…”
mentioning
confidence: 99%