2006
DOI: 10.1063/1.2336999
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Ferroelectric thin films: Review of materials, properties, and applications

Abstract: An overview of the state of art in ferroelectric thin films is presented. First, we review applications: microsystems' applications, applications in high frequency electronics, and memories based on ferroelectric materials. The second section deals with materials, structure ͑domains, in particular͒, and size effects. Properties of thin films that are important for applications are then addressed: polarization reversal and properties related to the reliability of ferroelectric memories, piezoelectric nonlineari… Show more

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Cited by 1,593 publications
(1,056 citation statements)
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References 417 publications
(390 reference statements)
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“…The thickness of the coherent films is much larger than the critical thickness for strain relaxation predicted by the MatthewsBlakeslee model and suggests better agreement with the People and Bean model. The temperature evolution of the a-lattice and c-lattice parameter of the ferroelectric films agrees well with the model of Pertsev et al 7 The present work clarifies that the 20% of a domains predicted by the model of Koukhar et al 9 for PTO on ͑001͒-STO, which is supported by data points and widely adopted in literature 2,3 for PTO films thicker than 10 nm, is not necessarily the equilibrium solution. This solution is applicable if the initial PTO film is relaxed during growth by misfit dislocations into the cubic paraelectric phase.…”
Section: Discussionsupporting
confidence: 79%
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“…The thickness of the coherent films is much larger than the critical thickness for strain relaxation predicted by the MatthewsBlakeslee model and suggests better agreement with the People and Bean model. The temperature evolution of the a-lattice and c-lattice parameter of the ferroelectric films agrees well with the model of Pertsev et al 7 The present work clarifies that the 20% of a domains predicted by the model of Koukhar et al 9 for PTO on ͑001͒-STO, which is supported by data points and widely adopted in literature 2,3 for PTO films thicker than 10 nm, is not necessarily the equilibrium solution. This solution is applicable if the initial PTO film is relaxed during growth by misfit dislocations into the cubic paraelectric phase.…”
Section: Discussionsupporting
confidence: 79%
“…2,3,6,[8][9][10] Domain structures arise when this phase is cooled through T c . In such a case the models of Koukhar et al 9 and Li et al 10 can be applied.…”
Section: Introductionmentioning
confidence: 99%
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“…[18][19][20][21]. These phenomena are often associated with the presence of nanoscale textures of domains or nanoscale phase separation [22][23][24].…”
mentioning
confidence: 99%
“…The ferroelectric layer can in some cases be partly interfaced with an interface layer with a low relative permittivity, e.g., due to material diffusion through the electrodes. The effect of the passive interface layer on the device properties of a parallel plate capacitor near a single metal-ferroelectric interface is described in [23,91] as…”
Section: Chapter 3 Ferroelectric Materials and Propertiesmentioning
confidence: 99%