2007
DOI: 10.1063/1.2750524
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Ferroelectric size effects in multiferroic BiFeO3 thin films

Abstract: Ferroelectric size effects in multiferroic BiFeO 3 have been studied using a host of complementary measurements. The structure of such epitaxial films has been investigated using atomic force microscopy, transmission electron microscopy, and x-ray diffraction. The crystal structure of the films has been identified as a monoclinic phase, which suggests that the polarization direction is close to ͗111͘. Such behavior has also been confirmed by piezoforce microscopy measurements. That also reveals that the ferroe… Show more

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Cited by 186 publications
(134 citation statements)
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“…The full width at half maximum of the rocking curve of the (006) h reflection ( fig. 1(c)) is 0.12 • , which is comparably narrow in comparison to reported values for films grown by sputtering [21,22], pulsed laser deposition [20,21,32] and molecular beam epitaxy [33], confirms the high crystalline quality of the films. This is however still four times as broad as for a bulk single crystal, indicating the presence of strain, inhomogeneity or mosaic spread.…”
supporting
confidence: 57%
“…The full width at half maximum of the rocking curve of the (006) h reflection ( fig. 1(c)) is 0.12 • , which is comparably narrow in comparison to reported values for films grown by sputtering [21,22], pulsed laser deposition [20,21,32] and molecular beam epitaxy [33], confirms the high crystalline quality of the films. This is however still four times as broad as for a bulk single crystal, indicating the presence of strain, inhomogeneity or mosaic spread.…”
supporting
confidence: 57%
“…Out-of-plane PFM measurements show that all the films are polarized down, also in agreement with previous reports. 18 In Fig. 2͑b͒, inplane PFM ͑IP-PFM͒ images of the same films are shown.…”
Section: Resultsmentioning
confidence: 99%
“…1͑c͔͒ in agreement with previous reports. 18 We have been able to understand why. This is confirmed by PFM imaging ͓Fig.…”
Section: Resultsmentioning
confidence: 99%
“…Its lead-free nature and large remanent polarization [4] have already motivated Fujitsu to use it as the active layer in prototype ferroelectric memories [5]; also, sublattice magnetic switching using voltage has been demonstrated [6], which may find its way into spintronic applications via exchange bias [7]. The possible coupling between ferroelectric and antiferromagnetic domains has triggered a flurry of work on the morphology and functional properties of the domains [6,[8][9][10][11]. Standard BFO films are generally found to have straightwalled domains which follow the well-known scaling law of Landau, Lifshitz, and Kittel (LLK) [12 -14], that is, domain width grows proportionally to the square root of film thickness [10].…”
mentioning
confidence: 99%