2006
DOI: 10.1002/pssc.200671589
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Femtosecond photoluminescence spectroscopy of silicon nanocrystals

Abstract: We report on the ultrafast photoluminescence dynamics in silicon nanocrystals measured by femtosecond up-conversion technique. The samples were prepared by embedding porous silicon grains in a sol-gel derived SiO 2 matrix. Efficient initial relaxation of the excess energy of photoexcited carriers with the effective rate ≥ 4 eV/ps was observed. The ultrafast photoluminescence decay (about 400 fs) was interpreted in terms of quenching the interior exciton radiative recombination by fast carrier trapping on the n… Show more

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Cited by 13 publications
(19 citation statements)
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“…6. We reported the same behaviour in our previous work [17]. On the other hand, for the (F) sample, the TPA and OPA excited PL spectra differ substantially.…”
Section: Polarization Properties Of the Plsupporting
confidence: 80%
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“…6. We reported the same behaviour in our previous work [17]. On the other hand, for the (F) sample, the TPA and OPA excited PL spectra differ substantially.…”
Section: Polarization Properties Of the Plsupporting
confidence: 80%
“…The decay rate depends in this case on the PL wavelength - PL decays to 1/e of its maximal value in 0.9 ps and 3.5 ps for wavelength 540 nm and 640 nm, respectively. This behaviour has been described in detail in our previous articles [16,17] and we shall not pay further attention to the (S) and (SF) samples PL decay.…”
Section: Ultrafast Luminescence Dynamicsmentioning
confidence: 75%
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