2014
DOI: 10.1038/ncomms6292
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Femtosecond electrons probing currents and atomic structure in nanomaterials

Abstract: The investigation of ultrafast electronic and structural dynamics in low-dimensional systems such as nanowires and two-dimensional materials requires femtosecond probes providing high spatial resolution and strong interaction with small volume samples. Low-energy electrons exhibit large scattering cross-sections and high sensitivity to electric fields, but their pronounced dispersion during propagation in vacuum so far prevented their use as femtosecond probe pulses in time-resolved experiments. Here, employin… Show more

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Cited by 120 publications
(163 citation statements)
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“…The tips are positioned by a 4-axis manipulator with nm-precision and are optionally mounted inside an electrostatic lens for focusing of the electron beam [3]. The corresponding electron optical system is very similar to that of a Schottky field emission gun in conventional high resolution electron microscopes using virtual point source cathodes [42].…”
Section: Resultsmentioning
confidence: 99%
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“…The tips are positioned by a 4-axis manipulator with nm-precision and are optionally mounted inside an electrostatic lens for focusing of the electron beam [3]. The corresponding electron optical system is very similar to that of a Schottky field emission gun in conventional high resolution electron microscopes using virtual point source cathodes [42].…”
Section: Resultsmentioning
confidence: 99%
“…The point-projection microscopy image is therefore primarily a measure of the electrostatic near-field rather than a shadow image of the geometric structure of the nanoobject. In particular, the point-projection image is sensitive to the doping profile in nanowires [3,50]. Figure 4 b) compares PPM images of a NW recorded in DC field emission mode without laser (top) and SPPdriven mode (bottom) with the same tip-sample distance d = 14 µm, corresponding to a geometric magnification of M ≈ 7000.…”
Section: Resultsmentioning
confidence: 99%
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“…An alternative approach is the lensless diffraction by a nanometric needle emitter directly in front of the sample [215]. The approach has shown to allow for about 250 fs temporal resolution at electron energies as low as 70 eV with excellent focusability.…”
Section: Further Improvements On the Gun Designmentioning
confidence: 99%