Features of changes in the microhardness of silicon crystals exposed to low-energy X-ray radiation

Steblenko, L. P.; Naumenko, S. N.; Kurylyuk, A. N.; Krit, O. N.; Kobzar, Yu. L.; Kalinichenko, D. V.; Kogutyuk, P. P.

doi:10.1134/s1027451015030349

Cited by 2 publications

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“…This can be caused by the simultaneous action of two opposite factors: electron generation and electron-hole recombination. It is known [10,[17][18] that Xirradiation of p-Si crystals leads to an increase in the dislocation path by about 3-4 times. In this case, the effect of increasing the mileage increases with an increase in the absorbed radiation dose, that is, there is a radiation-plastic effect.…”

Section: Resultsmentioning

confidence: 99%

Mechanically Stimulated Changes in Surface Electrical Conductivity of X-Irradiated Silicon Crystals

Lys¹,

Żyłka²,

Shykorjak³

et al. 2023

Adv. Sci. Technol. Res. J.

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Changes in the resistance of single crystals of p-type conductivity silicon under the action of mechanical loading were investigated in this research. Also, non-irradiated and pre-irradiated X-rays experimental samples were studied. It was found that at small deformation values when they are at the initial stage of the action of elastic deformation, a section forms and increases, on which the resistance practically does not depend on the applied mechanical load. In irradiated crystals, at small deformation values, electron generation processes dominate, which then recombine with the main carriers -holes. The consequence of such processes is the appearance of a maximum increase in electrical resistance at the initial stage of elastic deformation of experimental samples irradiated with X-rays. Charge carrier generation processes begin to dominate with further deformation. Such processes occur as a result of the release of acceptor centers from other complex defects, which are destroyed during the deformation of the Si crystal and captured by mobile dislocations. Thus, the processes of generation of charge carriers prevail over the processes of gettering and, accordingly, a mechano-stimulated decrease in the electrical resistance of p-Si samples occurs.

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Section: Resultsmentioning

confidence: 99%