Feasibility of Machine Learning Algorithm for Test Partitioning

Wang, Senling; Al-Awadhi, Hanan T.; Aohagi, Masatoshi; Higami, Yoshinobu; Takahashi, Hiroshi

doi:10.1109/itc-cscc.2019.8793328

2019 34th International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC) 2019

DOI: 10.1109/itc-cscc.2019.8793328

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Feasibility of Machine Learning Algorithm for Test Partitioning

Senling Wang

Hanan T. Al-Awadhi

Masatoshi Aohagi

et al.

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Feasibility of Machine Learning Algorithm for Test Partitioning

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References 13 publications

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