Abstract:Polarization properties in aperture-less scanning near-field optical microscopy (SNOM) were investigated using the 3D finite-difference time-domain (FDTD) method. We found that scattered light became elliptically polarized with linear or circular-polarized light illumination, and the polarization state of scattered light was preserved. In addition, Jones matrices that express the relationship between incident light and scattered light in terms of the polarization states were successfully obtained. We succeeded… Show more
“…8. show azimuth angles of SNOM signals measured for the azimuth angle of the incident light of 60°and demodulation frequencies Ω and 2Ω are plotted together with a result obtained by the FDTD simulation [30]. In the case of Ω, the azimuth angles of SNOM signals gradually increased with the angle of the azimuth of the incident light, which agreed with the result by FDTD.…”
Section: Resultssupporting
confidence: 82%
“…From the FDTD simulation, we also found that the a-SNOM system can be described by Jones matrix as described [30],…”
Section: Resultsmentioning
confidence: 90%
“…The size of our model was 3 × 3 × 3 μm 3 , using 3 × 3 × 3 nm 3 cell. The probe was set with normal to the Cr surface to study fundamental polarization properties of a-SNOM, although there was an inclination of approximately 10°in the actual experiment [29,30].…”
Polarization properties of apertureless-type scanning near-field optical microscopy (a-SNOM) were measured experimentally and were also analyzed using a finite-difference time-domain (FDTD) simulation. Our study reveals that the polarization properties in the a-SNOM are maintained and the a-SNOM works as a wave plate expressed by a Jones matrix. The measured signals obtained by the lock-in detection technique could be decomposed into signals scattered from near-field region and background signals reflected by tip and sample. Polarization images measured by a-SNOM with an angle resolution of 1°are shown. FDTD analysis also reveals the polarization properties of light in the area between a tip and a sample are p-polarization in most of cases.
“…8. show azimuth angles of SNOM signals measured for the azimuth angle of the incident light of 60°and demodulation frequencies Ω and 2Ω are plotted together with a result obtained by the FDTD simulation [30]. In the case of Ω, the azimuth angles of SNOM signals gradually increased with the angle of the azimuth of the incident light, which agreed with the result by FDTD.…”
Section: Resultssupporting
confidence: 82%
“…From the FDTD simulation, we also found that the a-SNOM system can be described by Jones matrix as described [30],…”
Section: Resultsmentioning
confidence: 90%
“…The size of our model was 3 × 3 × 3 μm 3 , using 3 × 3 × 3 nm 3 cell. The probe was set with normal to the Cr surface to study fundamental polarization properties of a-SNOM, although there was an inclination of approximately 10°in the actual experiment [29,30].…”
Polarization properties of apertureless-type scanning near-field optical microscopy (a-SNOM) were measured experimentally and were also analyzed using a finite-difference time-domain (FDTD) simulation. Our study reveals that the polarization properties in the a-SNOM are maintained and the a-SNOM works as a wave plate expressed by a Jones matrix. The measured signals obtained by the lock-in detection technique could be decomposed into signals scattered from near-field region and background signals reflected by tip and sample. Polarization images measured by a-SNOM with an angle resolution of 1°are shown. FDTD analysis also reveals the polarization properties of light in the area between a tip and a sample are p-polarization in most of cases.
“…The size of our model was 3 × 3 × 3 μm 3 , using 3 × 3 × 3 nm 3 cell. The probe was set with normal to the Cr surface to study fundamental polarization properties of a-SNOM, although there was an inclination of approximately 10° in the actual experiment [ 29 , 30 ]. Fig.…”
Polarization properties of apertureless-type scanning near-field optical microscopy (a-SNOM) were measured experimentally and were also analyzed using a finite-difference time-domain (FDTD) simulation. Our study reveals that the polarization properties in the a-SNOM are maintained and the a-SNOM works as a wave plate expressed by a Jones matrix. The measured signals obtained by the lock-in detection technique could be decomposed into signals scattered from near-field region and background signals reflected by tip and sample. Polarization images measured by a-SNOM with an angle resolution of 1° are shown. FDTD analysis also reveals the polarization properties of light in the area between a tip and a sample are p-polarization in most of cases.
“…We have developed an aSNOM with a high spatial resolution of 14 nm, (10) and we have found that the polarization state of the scattered light is preserved. (11)(12)(13) In this study, we report on SPP measurement in cross grooves made of Au by aSNOM with a high spatial resolution.…”
We measured the distribution of surface plasmon polaritons (SPPs) on cross grooves fabricated in Au film by apertureless scanning near-field optical microscopy (aSNOM). SNOM signals around horizontal and vertical grooves had double peaks and a single peak, respectively. To understand these different behaviors, we carried out simulations by the finite element method. From the simulation results, we found that the double peaks that appeared near the left and right edges of the horizontal groove were due to localized surface plasmons (LSPs). On the other hand, the strong signal that appeared near the center of the vertical groove was due to channel plasmon polariton. The SPP excitation depended on the direction of the electric field of the incident light and the cross sections of the grooves. This experiment reveals that aSNOM is a powerful tool for observing the distribution of SPPs on the nanoscale.
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