1999 IEEE MTT-S International Microwave Symposium Digest (Cat. No.99CH36282)
DOI: 10.1109/mwsym.1999.780257
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FDTD accuracy improvement by incorporation of 3D edge singularities

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Cited by 8 publications
(4 citation statements)
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“…Furthermore, the effect of the triple junctions would remain, so no improvement would be achieved overall. Other numerical methods like finite difference analysis do not provide sufficient approaches yet to deal with sensitivities but rather discretization errors of electric field strength 67–69 …”
Section: Discussionmentioning
confidence: 99%
See 1 more Smart Citation
“…Furthermore, the effect of the triple junctions would remain, so no improvement would be achieved overall. Other numerical methods like finite difference analysis do not provide sufficient approaches yet to deal with sensitivities but rather discretization errors of electric field strength 67–69 …”
Section: Discussionmentioning
confidence: 99%
“…Other numerical methods like finite difference analysis do not provide sufficient approaches yet to deal with sensitivities but rather discretization errors of electric field strength. [67][68][69] In the case of FEM, two of these existing methods, the LM and the VM, were altered in this study to also account for singularities in sensitivities. Overall, both methods provide consistent results in terms of the size and shape of the SVs.…”
Section: Sensitivitiesmentioning
confidence: 99%
“…The approximation of step changes in , while convenient mathematically, is known to produce singularities in local fields and their gradients at internal corners and edges [20]. These singularities are square integrable, as is required for conservation of energy, but are generally not fully resolvable with standard FDTD, FEM, and RCWA methods, though specialized methods have been proposed to treat some of the singularities in particular geometries [21][22][23]. The cylindrical geometry considered here contains no corners and the active region of GaAs is convex, so the field singularities inside the nanowire material are relatively benign, but they are not accurately modeled here.…”
Section: Substratementioning
confidence: 99%
“…This approach is used in [4] and [5] for the two-dimensional (2-D) case and where the edge of the strip coincides with the edges of the FDTD cells. A similar approach is used in [6] to model a coplanar line and is extended in [7] to the analysis of a three-dimensional (3-D) coplanar open stub, including the effects of a right angle bend.…”
Section: Comparison With Previous Workmentioning
confidence: 99%