2002
DOI: 10.1109/43.992771
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Fault simulation and test algorithm generation for random access memories

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Cited by 35 publications
(1 citation statement)
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“…How do we test them by serial interfacing efficiently? Some march tests which use parallel interfacing technique for p-port memories have been proposed in [7] [33], but no research has been done on serial interfacing. This must be investigated and solved as more and more applications do require embedded memories with a large number of ports to enhance the circuit performance.…”
Section: Chaptermentioning
confidence: 99%
“…How do we test them by serial interfacing efficiently? Some march tests which use parallel interfacing technique for p-port memories have been proposed in [7] [33], but no research has been done on serial interfacing. This must be investigated and solved as more and more applications do require embedded memories with a large number of ports to enhance the circuit performance.…”
Section: Chaptermentioning
confidence: 99%