Fault Diagnosis of the Electric Multiple Unit Door System by Machine Learning Using Sensor Signal of the Simulator

Kang, Gil Hyun; Kim, Kyung Sik; Chang, Chin Young; Kim, Chul Su

doi:10.1007/s42835-024-02003-6

J. Electr. Eng. Technol.

2024

DOI: 10.1007/s42835-024-02003-6

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Fault Diagnosis of the Electric Multiple Unit Door System by Machine Learning Using Sensor Signal of the Simulator

Gil Hyun Kang,

Kyung Sik Kim,

Chin Young Chang

et al.

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Fault Diagnosis of the Electric Multiple Unit Door System by Machine Learning Using Sensor Signal of the Simulator

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References 14 publications

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