Fault Detection, Localization and Clearance for MMC based on Indirect Finite Control Set Model Predictive Control
Saad Hamayoon,
Morten Hovd,
Jon Are Suul
Abstract:In this paper, indirect finite control set model predictive control (I-FCS-MPC) is used for detecting, localizing, and tolerating open-circuit failures in the transistors without the use of arm voltage sensors. The fault is detected by the main controller whereas the localization is performed in the local controller which is used for the sorting algorithm. The main controller utilizes the discrete mathematical model to estimate the arm voltages using state measurements from present and previous sampling instan… Show more
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